SCOPUS 정보 검색 플랫폼

X-Ray Spectrometry

Volumn 26, Issue 5, 1997, Pages 291-302

Electron Probe Microanalysis of Insulating Oxides: Monte Carlo Simulations

(4) Jbara, O a Portron, B a Mouze, D a Cazaux, J a

a UNIVERSITÉ DE REIMS CHAMPAGNE ARDENNE (France)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; ALUMINUM OXIDE; ANGULAR DISTRIBUTION; ELECTRON PROBE MICROANALYSIS; INTELLIGENT SYSTEMS; MAGNESIA; MONTE CARLO METHODS; NIOBIUM OXIDE; SILICA;

BINARY OXIDES; CHARACTERISTIC X RAYS; DEPTH DISTRIBUTION; ELECTRON PROBE MICROANALYSES; ELECTRON-PROBE MICROANALYSIS; KΑ; MONTE CARLO SIMULATION METHODS; MONTE CARLO'S SIMULATION; X RAY INTENSITY; X-RAY PRODUCTIONS;

ELECTRIC FIELDS;

EID: 0031478021 PISSN: 00498246 EISSN: None Source Type: Journal
DOI: 10.1002/(SICI)1097-4539(199709)26:5<291::AID-XRS226>3.0.CO;2-X Document Type: Article

Times cited : (29)

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