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Volumn 8, Issue 5, 1997, Pages 508-513
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Interpretation of atomic force microscope (AFM) signals from surface charge on insulators
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRIC CHARGE;
ELECTRIC INSULATORS;
OPTICAL RESOLVING POWER;
SURFACE PHENOMENA;
DECAY CURVES;
SURFACE CONDUCTION;
ATOMIC FORCE MICROSCOPY;
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EID: 0031140771
PISSN: 09570233
EISSN: None
Source Type: Journal
DOI: 10.1088/0957-0233/8/5/007 Document Type: Article |
Times cited : (39)
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References (27)
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