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Volumn 8, Issue 5, 1997, Pages 508-513

Interpretation of atomic force microscope (AFM) signals from surface charge on insulators

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CHARGE; ELECTRIC INSULATORS; OPTICAL RESOLVING POWER; SURFACE PHENOMENA;

EID: 0031140771     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/8/5/007     Document Type: Article
Times cited : (39)

References (27)
  • 3
    • 4143063231 scopus 로고
    • News report
    • Cahur S 1994 News report IEEE Spectrum 31 (11) p 1
    • (1994) IEEE Spectrum , vol.31 , Issue.11 , pp. 1
    • Cahur, S.1
  • 5
    • 0020203283 scopus 로고
    • _1982 J. Appl. Phys. 53 7425-35
    • (1982) J. Appl. Phys. , vol.53 , pp. 7425-7435
  • 13
    • 85034738556 scopus 로고
    • MSc Thesis Queen's University, Kingston, Canada
    • Pépin M P 1992 MSc Thesis Queen's University, Kingston, Canada
    • (1992)
    • Pépin, M.P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.