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Volumn 188, Issue 3-4, 2002, Pages 245-251

Dynamic force microscopy with atomic resolution at low temperatures

Author keywords

Atomic resolution; Exchange force; HOPG; Low temperature force microscopy; Tip induced relaxation; Van der Waals crystal

Indexed keywords

ATOMIC FORCE MICROSCOPY; FERROMAGNETISM; GRAPHITE; IMAGING TECHNIQUES; OPTICAL RESOLVING POWER; RELAXATION PROCESSES; ULTRAHIGH VACUUM; VAN DER WAALS FORCES;

EID: 0037187224     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(02)00146-0     Document Type: Conference Paper
Times cited : (20)

References (44)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.