Artifact and fact of Si(111)7×7 surface images observed with a low temperature noncontact atomic force microscope (LT-NC-AFM)

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 40, Issue 3 B, 2001, Pages

  Suehira, N ^a   Sugawara, Y ^a   Morita, S ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

Low temperature AFM; Noncontact AFM; Silicon(100); Silicon(111)

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL ORIENTATION; CRYSTAL STRUCTURE; DIMERS; LOW TEMPERATURE PHENOMENA; SURFACE CHEMISTRY;

LOW TEMPERATURE NONCONTACT ATOMIC FORCE MICROSCOPY (LT-NC-AFM); SURFACE IMAGES;

SEMICONDUCTING SILICON;

EID: 0035867892     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.40.l292     Document Type: Article

References (23)