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Applied Physics A: Materials Science and Processing

Volumn 72, Issue 7, 2001, Pages

Dynamic low-temperature scanning force microscopy on nickel oxide (001)

(3) Allers, W a Langkat, S a Wiesendanger, R a

a UNIVERSITY OF HAMBURG (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0012838403 PISSN: 09478396 EISSN: None Source Type: Journal
DOI: 10.1007/s003390100731 Document Type: Article

Times cited : (32)

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