Strain engineering, self-assembly, and nanoarchitectures in thin SiGe films on Si

Materials Science and Engineering B: Solid-State Materials for Advanced Technology

Volumn 96, Issue 2, 2002, Pages 94-101

  Woll, A R ^a   Rugheimer, P ^a   Lagally, M G ^a  

^a UNIVERSITY OF WISCONSIN MADISON   (United States)

Author keywords

Quantum dot (QD); Self assembly; Self ordering

Indexed keywords

MULTILAYERS; SELF ASSEMBLY; SEMICONDUCTOR QUANTUM DOTS; SILICON COMPOUNDS; SIZE DETERMINATION; STRAIN;

NANOARCHITECTURES; STRAIN ENGINEERING;

THIN FILMS;

EID: 0036840778     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(02)00298-2     Document Type: Article

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