Germanium "quantum dots" embedded in silicon: Quantitative study of self-alignment and coarsening

Applied Physics Letters

Volumn 74, Issue 2, 1999, Pages 269-271

  Kienzle, O ^a   Ernst, F ^a   Ruhle M ^a   Schmidt, O G ^b   Eberl, K ^b  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^b MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001495376     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.123277     Document Type: Article

References (23)

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