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Volumn 380, Issue 1-2, 2000, Pages 25-28
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Interplay of dislocation network and island arrangement in SiGe films grown on Si(001)
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
DISLOCATIONS (CRYSTALS);
FILM GROWTH;
MOLECULAR BEAM EPITAXY;
NANOSTRUCTURED MATERIALS;
SEMICONDUCTING SILICON;
SEMICONDUCTING SILICON COMPOUNDS;
SURFACE ROUGHNESS;
SEMICONDUCTOR HETEROEPITAXY;
SEMICONDUCTING FILMS;
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EID: 0034497154
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/S0040-6090(00)01463-2 Document Type: Article |
Times cited : (44)
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References (15)
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