메뉴 건너뛰기




Volumn 46, Issue 6, 2002, Pages 827-835

The influence of band offsets on the IV characteristics for GaN/SiC heterojunctions

Author keywords

Band offset; GaN SiC heterojunction; Midgap theory

Indexed keywords

CHARGE CARRIERS; FILM GROWTH; MOLECULAR BEAM EPITAXY; SEMICONDUCTING GALLIUM COMPOUNDS; SEMICONDUCTOR DIODES; SILICON CARBIDE;

EID: 0036604810     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(01)00346-X     Document Type: Article
Times cited : (19)

References (39)
  • 14
    • 36149004075 scopus 로고
    • Electron-hole recombination in germanium
    • (1952) Phys Rev , vol.87 , Issue.2 , pp. 387
    • Hall, R.N.1
  • 22
    • 0002208092 scopus 로고
    • Measurements of energy band offsets using capacitance and current measurement techniques
    • Capasso F., Margaritondo G., editors. Amsterdam: Elsevier science publishers BV
    • (1987) Heterojunction band discontinuities , pp. 311-375
    • Forrest, S.R.1
  • 30
  • 36
    • 20544463421 scopus 로고
    • Schottky barrier height of metal contacts to p-type alpha 6H-SiC
    • (1994) J Appl Phys , vol.75 , Issue.9 , pp. 4548-4550
    • Waldrop, J.R.1
  • 37
    • 21544450621 scopus 로고
    • Schottky barrier height and interface chemistry of annealed metal contacts to alpha 6H-SiC: Crystal face dependence
    • (1993) Appl Phys Lett , vol.62 , Issue.21 , pp. 2685-2687
    • Waldrop, J.R.1    Grant, R.W.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.