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Volumn 44, Issue 7, 2000, Pages 1229-1233
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GaN/SiC heterojunction bipolar transistors
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Author keywords
[No Author keywords available]
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Indexed keywords
CARRIER MOBILITY;
CRYSTAL DEFECTS;
ELECTROLUMINESCENCE;
ENERGY GAP;
LEAKAGE CURRENTS;
PHOTOLUMINESCENCE;
REACTIVE ION ETCHING;
SEMICONDUCTING GALLIUM COMPOUNDS;
SEMICONDUCTING SILICON COMPOUNDS;
SEMICONDUCTOR DEVICE MANUFACTURE;
SEMICONDUCTOR GROWTH;
SILICON CARBIDE;
GALLIUM NITRIDE;
PARASITIC DEEP DEFECT LEVEL;
HETEROJUNCTION BIPOLAR TRANSISTORS;
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EID: 0033734305
PISSN: 00381101
EISSN: None
Source Type: Journal
DOI: 10.1016/S0038-1101(00)00033-2 Document Type: Article |
Times cited : (19)
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References (14)
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