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Volumn 46, Issue 5, 2002, Pages 721-734

Substrate-triggered ESD clamp devices for use in power-rail ESD clamp circuits

Author keywords

Bipolar junction transistor; Electrostatic discharge; Electrostatic discharge clamp circuit; Secondary breakdown current (It2); Substrate triggered technique

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC CURRENTS; ELECTRIC DISCHARGES; GATES (TRANSISTOR); SEMICONDUCTING SILICON; SUBSTRATES; TRIGGER CIRCUITS;

EID: 0036568226     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(01)00317-3     Document Type: Article
Times cited : (13)

References (35)
  • 12
    • 0032740282 scopus 로고    scopus 로고
    • Whole-chip ESD protection design with efficient VDD-to-VSS ESD clamp circuits for submicron CMOS VLSI
    • (1999) IEEE Trans Electron Dev , vol.46 , Issue.1 , pp. 173-183
    • Ker, M.-D.1
  • 27
    • 0037691090 scopus 로고    scopus 로고
    • IC Latch-up Test
    • Electronics Industries Association
    • (1997) EIA/JEDEC standard , vol.78


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.