ESD protection for mixed-voltage I/O using NMOS transistors stacked in a cascode configuration

Electrical Overstress/Electrostatic Discharge Symposium Proceedings

Volumn , Issue , 1998, Pages 54-62

  Anderson, Warren R ^a   Krakauer, David B ^a  

^a HEWLETT PACKARD COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC DISCHARGES; ELECTROSTATICS; MOSFET DEVICES; TRIGGER CIRCUITS;

ELECTROSTATIC DISCHARGE (ESD) PROTECTION;

ELECTRIC SHIELDING;

EID: 0032316866     PISSN: 07395159     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)