Substrate triggered lateral bipolar circuit for high voltage tolerant ESD protection applications

Electrical Overstress/Electrostatic Discharge Symposium Proceedings

Volumn , Issue , 1998, Pages 63-71

  Smith, Jeremy C ^a  

^a MOTOROLA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR INTEGRATED CIRCUITS; CAPACITANCE; CMOS INTEGRATED CIRCUITS; ELECTRIC DISCHARGES; ELECTROSTATICS; LEAKAGE CURRENTS;

ELECTROSTATIC DISCHARGE (ESD) PROTECTION; SUBSTRATE TRIGGERED LATERAL BIPOLAR CIRCUITS;

ELECTRIC SHIELDING;

EID: 0032316868     PISSN: 07395159     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)