Investigation of microdefects in multicrystalline silicon for photovoltaic applications

Solid State Phenomena

Volumn 47-48, Issue , 1996, Pages 449-454

  Werner, M ^a   Weber, E R ^b   McHugo, S ^b   Hieslmair, H ^b   Chapman, K L ^c  

^a MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; ELECTRON ENERGY LEVELS; ELECTRON MICROSCOPES; ELECTRON SCATTERING; ENERGY DISSIPATION; POLYCRYSTALLINE MATERIALS; POLYSILICON; PRECIPITATION (CHEMICAL); SEMICONDUCTOR DEVICE MANUFACTURE; SILICIDES; SILICON SOLAR CELLS;

AS-GROWN; FE DIFFUSION; HIGH RESOLUTION AND ANALYTICAL ELECTRON MICROSCOPY; MICRO-DEFECTS; MICRO-PROBES; MULTI-CRYSTALLINE SILICON; PHOTOVOLTAIC APPLICATIONS;

ELECTRON ENERGY LOSS SPECTROSCOPY;

EID: 17544363090     PISSN: 10120394     EISSN: None     Source Type: Book Series    
DOI: None     Document Type: Article

References (6)

1. See, e.g., Narayanan, S., Wenham, S.R. and Green, M.A.: IEEE Trans. Electron Dev.1990,37, 382
2. Bailey, J., Kalejs, J.P. and Keaveny, C.: Proc.1st World Conf.Photovoltaic Energ. Conversion, Hawaii 1994, in pres s
3. Gilles, D., Weber, E.R. and Hahn, S.: Phys. Rev. Lett 1990, 64, 196
4. Bailey, J. and Weber, E.R.: Phys. stat. sol., 1993, A 137, 515
5. McHugo, S.A. and Sawyer, W.D.: Appl. Phys. Lett., 1993, 62, 2519
6. Chapman, K.L., Werner, M. Hieslmair, H. and Weber, E.R.: unpubl.