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Volumn 160, Issue 1, 1997, Pages 271-282

Evaluation of local electrical parameters of solar cells by dynamic (lock-in) thermography

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT DENSITY; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CURRENTS; THERMAL DIFFUSION IN SOLIDS; THERMOGRAPHY (TEMPERATURE MEASUREMENT);

EID: 0031096108     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-396X(199703)160:1<271::AID-PSSA271>3.0.CO;2-5     Document Type: Article
Times cited : (31)

References (9)
  • 3
    • 4244101501 scopus 로고    scopus 로고
    • Ed. W. FREISLEBEN, W. PALZ, H. A. OSSENBRINK, and P. HELM, H. S. Stephens Associate, Felmershain
    • C. HÄSSLER, S. THURM, and W. KOCH, Proc. 13th Europ. PSEC, Ed. W. FREISLEBEN, W. PALZ, H. A. OSSENBRINK, and P. HELM, H. S. Stephens Associate, Felmershain 1996 (pp. 1364 to 1367).
    • (1996) Proc. 13th Europ. PSEC , pp. 1364-1367
    • Hässler, C.1    Thurm, S.2    Koch, W.3
  • 4
    • 5744247013 scopus 로고    scopus 로고
    • Univ. Erlangen, unpublished
    • D. KARG, C. HÄSSLER, and G. PENSL, Univ. Erlangen, unpublished. See also O. BREITENSTEIN, K. IWIG, and I. KONOVALOV, Proc. 6th NREL Workshop on Impurities and Defects in Silicon Device Processing, Snowmass 1996 (pp. 52 to 58).
    • Karg, D.1    Hässler, C.2    Pensl, G.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.