Elimination of endpoint-discontinuity artifacts in the analysis of spectra in reciprocal space

Journal of Applied Physics

Volumn 89, Issue 12, 2001, Pages 8183-8192

  Yoo, S D ^a,b   Aspnes, D E ^a  

^a NORTH CAROLINA STATE UNIVERSITY   (United States)

^b Baekang Bldg 7F   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035875283     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1368391     Document Type: Article

References (60)

1. M. Cardona, Modulation Spectroscopy (Academic, New York, 1969); D. E. Aspnes, in Handbook on Semiconductors, Vol. 2, edited by M. Balkanski (North-Holland, Amsterdam, 1980); P. Y. Yu and M. Cardona, Fundamentals of Semiconductors (Springer, Berlin, 1996).
2. M. Cardona, Modulation Spectroscopy (Academic, New York, 1969); D. E. Aspnes, in Handbook on Semiconductors, Vol. 2, edited by M. Balkanski (North-Holland, Amsterdam, 1980); P. Y. Yu and M. Cardona, Fundamentals of Semiconductors (Springer, Berlin, 1996).
3. M. Cardona, Modulation Spectroscopy (Academic, New York, 1969); D. E. Aspnes, in Handbook on Semiconductors, Vol. 2, edited by M. Balkanski (North-Holland, Amsterdam, 1980); P. Y. Yu and M. Cardona, Fundamentals of Semiconductors (Springer, Berlin, 1996).
4. C. C. Kim, J. W. Garland, H. Abad, and P. M. Raccah, Phys. Rev. 45, 11749 (1992).
5. C. C. Kim, J. W. Garland, and P. M. Raccah, Phys. Rev. B 47, 1876 (1993).
6. J. W. Garland, C. C. Kim, H. Abad, and P. M. Raccah, Thin Solid Films 233, 148 (1993).
7. H. W. Verleur, J. Opt. Soc. Am. 88, 1356 (1968); B. G. Martin and R. F. Wallis, Solid State Commun. 21, 385 (1977); M. Erman, J. B. Theeten, P. Chambon, S. M. Kelso, and D. E. Aspnes, J. Appl. Phys. 56, 2664 (1984).
8. H. W. Verleur, J. Opt. Soc. Am. 88, 1356 (1968); B. G. Martin and R. F. Wallis, Solid State Commun. 21, 385 (1977); M. Erman, J. B. Theeten, P. Chambon, S. M. Kelso, and D. E. Aspnes, J. Appl. Phys. 56, 2664 (1984).
9. H. W. Verleur, J. Opt. Soc. Am. 88, 1356 (1968); B. G. Martin and R. F. Wallis, Solid State Commun. 21, 385 (1977); M. Erman, J. B. Theeten, P. Chambon, S. M. Kelso, and D. E. Aspnes, J. Appl. Phys. 56, 2664 (1984).
10. S. Adachi, Phys. Rev. 35, 7454 (1987); 41, 1003 (1990); D. W. Jenkins, J. Appl. Phys. 68, 1848 (1990); C. M. Herzinger, B. Johs, W. A. McGahan, J. A. Woollam, and W. Paulson, ibid. 83, 3323 (1998).
11. S. Adachi, Phys. Rev. 35, 7454 (1987); 41, 1003 (1990); D. W. Jenkins, J. Appl. Phys. 68, 1848 (1990); C. M. Herzinger, B. Johs, W. A. McGahan, J. A. Woollam, and W. Paulson, ibid. 83, 3323 (1998).
12. S. Adachi, Phys. Rev. 35, 7454 (1987); 41, 1003 (1990); D. W. Jenkins, J. Appl. Phys. 68, 1848 (1990); C. M. Herzinger, B. Johs, W. A. McGahan, J. A. Woollam, and W. Paulson, ibid. 83, 3323 (1998).
13. S. Adachi, Phys. Rev. 35, 7454 (1987); 41, 1003 (1990); D. W. Jenkins, J. Appl. Phys. 68, 1848 (1990); C. M. Herzinger, B. Johs, W. A. McGahan, J. A. Woollam, and W. Paulson, ibid. 83, 3323 (1998).
14. A. Savitzky and J. J. E. Golay, Anal. Chem. 36, 1627 (1964).
15. D. E. Aspnes, Surf. Sci. 135, 284 (1983).
16. D. E. Aspnes and H. Arwin, J. Opt. Soc. Am. 73, 1759 (1983); D. E. Aspnes and S. M. Kelso, Proc. SPIE 452, 79 (1983).
17. D. E. Aspnes and H. Arwin, J. Opt. Soc. Am. 73, 1759 (1983); D. E. Aspnes and S. M. Kelso, Proc. SPIE 452, 79 (1983).
18. D. E. Aspnes, Sol. Energy Mater. Sol. Cells 32, 413 (1994).
19. S. D. Yoo, N. V. Edwards, and D. E. Aspnes, Thin Solid Films 313-314, 143 (1998).
20. D. E. Aspnes and S. D. Yoo, Phys. Status Solidi B 215, 715 (1999).
21. N. V. Edwards et al., Appl. Phys. Lett. 70, 2001 (1997); N. V. Edwards et al., Mater. Res. Soc. Symp. Proc. 449, 781 (1997); N. V. Edwards et al., Mater. Sci. Eng. B 50, 134 (1997); N. V. Edwards et al., Thin Solid Films 313-314, 187 (1998); N. V. Edwards, M. D. Bremser, R. F. Davis, A. D. Batchelor, S. D. Yoo, C. Karan, and D. E. Aspnes, Appl. Phys. Lett. 73, 2808 (1998).
22. N. V. Edwards et al., Appl. Phys. Lett. 70, 2001 (1997); N. V. Edwards et al., Mater. Res. Soc. Symp. Proc. 449, 781 (1997); N. V. Edwards et al., Mater. Sci. Eng. B 50, 134 (1997); N. V. Edwards et al., Thin Solid Films 313-314, 187 (1998); N. V. Edwards, M. D. Bremser, R. F. Davis, A. D. Batchelor, S. D. Yoo, C. Karan, and D. E. Aspnes, Appl. Phys. Lett. 73, 2808 (1998).
23. N. V. Edwards et al., Appl. Phys. Lett. 70, 2001 (1997); N. V. Edwards et al., Mater. Res. Soc. Symp. Proc. 449, 781 (1997); N. V. Edwards et al., Mater. Sci. Eng. B 50, 134 (1997); N. V. Edwards et al., Thin Solid Films 313-314, 187 (1998); N. V. Edwards, M. D. Bremser, R. F. Davis, A. D. Batchelor, S. D. Yoo, C. Karan, and D. E. Aspnes, Appl. Phys. Lett. 73, 2808 (1998).
24. N. V. Edwards et al., Appl. Phys. Lett. 70, 2001 (1997); N. V. Edwards et al., Mater. Res. Soc. Symp. Proc. 449, 781 (1997); N. V. Edwards et al., Mater. Sci. Eng. B 50, 134 (1997); N. V. Edwards et al., Thin Solid Films 313-314, 187 (1998); N. V. Edwards, M. D. Bremser, R. F. Davis, A. D. Batchelor, S. D. Yoo, C. Karan, and D. E. Aspnes, Appl. Phys. Lett. 73, 2808 (1998).
25. N. V. Edwards et al., Appl. Phys. Lett. 70, 2001 (1997); N. V. Edwards et al., Mater. Res. Soc. Symp. Proc. 449, 781 (1997); N. V. Edwards et al., Mater. Sci. Eng. B 50, 134 (1997); N. V. Edwards et al., Thin Solid Films 313-314, 187 (1998); N. V. Edwards, M. D. Bremser, R. F. Davis, A. D. Batchelor, S. D. Yoo, C. Karan, and D. E. Aspnes, Appl. Phys. Lett. 73, 2808 (1998).
26. S. D. Yoo, D. E. Aspnes, S. J. Rhee, and J. C. Woo, Appl. Phys. Lett. 68, 3230 (1996).
27. S. D. Yoo, D. E. Aspnes, S. J. Rhee, H. S. Ko, Y. M. Kim, and J. C. Woo, Inst. Phys. Conf. Ser. 145, 313 (1996).
28. S. D. Yoo, D. E. Aspnes, A. Lastras-Martínez, T. Ruf, M. Konuma, M. Cardona, and D. E. Aspnes, Phys. Status Solidi A 177, 157 (2000); L. F. Lastras-Martínez, T. Ruf, M. Konuma, M. Cardona, and D. E. Aspnes, Phys. Rev. 61, 12 946 (2000).
29. S. D. Yoo, D. E. Aspnes, A. Lastras-Martínez, T. Ruf, M. Konuma, M. Cardona, and D. E. Aspnes, Phys. Status Solidi A 177, 157 (2000); L. F. Lastras-Martínez, T. Ruf, M. Konuma, M. Cardona, and D. E. Aspnes, Phys. Rev. 61, 12 946 (2000).
30. K. A. Bell, M. Ebert, S. D. Yoo, K. Flock, and D. E. Aspnes, J. Electron. Mater. 29, 106 (2000); M. Ebert, K. A. Bell, S. D. Yoo, K. Flock, and D. E. Aspnes, Thin Solid Films 364, 22 (2000); K. A. Bell, M. Ebert, S. D. Yoo, K. Flock, and D. E. Aspnes, J. Vac. Sci. Technol. A 18, 1184 (2000).
31. K. A. Bell, M. Ebert, S. D. Yoo, K. Flock, and D. E. Aspnes, J. Electron. Mater. 29, 106 (2000); M. Ebert, K. A. Bell, S. D. Yoo, K. Flock, and D. E. Aspnes, Thin Solid Films 364, 22 (2000); K. A. Bell, M. Ebert, S. D. Yoo, K. Flock, and D. E. Aspnes, J. Vac. Sci. Technol. A 18, 1184 (2000).
32. K. A. Bell, M. Ebert, S. D. Yoo, K. Flock, and D. E. Aspnes, J. Electron. Mater. 29, 106 (2000); M. Ebert, K. A. Bell, S. D. Yoo, K. Flock, and D. E. Aspnes, Thin Solid Films 364, 22 (2000); K. A. Bell, M. Ebert, S. D. Yoo, K. Flock, and D. E. Aspnes, J. Vac. Sci. Technol. A 18, 1184 (2000).
33. D. P. Wang and C. T. Chen, Appl. Phys. Lett. 67, 2069 (1995); D. P. Wang and C. T. Chen, ibid. 68, 1585 (1996); J. Nukeaw, Y. Fujiwara, Y. Takeda, M. Funato, S. Aoki, S. Fujita, and S. Fujita, Thin Solid Films 334, 11 (1998).
34. D. P. Wang and C. T. Chen, Appl. Phys. Lett. 67, 2069 (1995); D. P. Wang and C. T. Chen, ibid. 68, 1585 (1996); J. Nukeaw, Y. Fujiwara, Y. Takeda, M. Funato, S. Aoki, S. Fujita, and S. Fujita, Thin Solid Films 334, 11 (1998).
35. D. P. Wang and C. T. Chen, Appl. Phys. Lett. 67, 2069 (1995); D. P. Wang and C. T. Chen, ibid. 68, 1585 (1996); J. Nukeaw, Y. Fujiwara, Y. Takeda, M. Funato, S. Aoki, S. Fujita, and S. Fujita, Thin Solid Films 334, 11 (1998).
36. V. L. Alperovich, A. S. Jaroshevich, H. E. Schreiber, and A. S. Terekhov, Solid-State Electron. 37, 657 (1994); R. T. Holm, O. J. Glembacki, and J. A. Tuchman, Mater. Res. Soc. Symp. Proc. 406, 247 (1996); V. L. Alperovich, A. S. Jaroshevich, H. E. Scheibler, A. S. Terekhov, and R. L. Tober, Appl. Phys. Lett. 71, 2788 (1997).
37. V. L. Alperovich, A. S. Jaroshevich, H. E. Schreiber, and A. S. Terekhov, Solid-State Electron. 37, 657 (1994); R. T. Holm, O. J. Glembacki, and J. A. Tuchman, Mater. Res. Soc. Symp. Proc. 406, 247 (1996); V. L. Alperovich, A. S. Jaroshevich, H. E. Scheibler, A. S. Terekhov, and R. L. Tober, Appl. Phys. Lett. 71, 2788 (1997).
38. V. L. Alperovich, A. S. Jaroshevich, H. E. Schreiber, and A. S. Terekhov, Solid-State Electron. 37, 657 (1994); R. T. Holm, O. J. Glembacki, and J. A. Tuchman, Mater. Res. Soc. Symp. Proc. 406, 247 (1996); V. L. Alperovich, A. S. Jaroshevich, H. E. Scheibler, A. S. Terekhov, and R. L. Tober, Appl. Phys. Lett. 71, 2788 (1997).
39. R. P. Vasquez, J. D. Klein, J. J. Barton, and F. J. Grunthaner, J. Electron Spectrosc. Relat. Phenom. 23, 63 (1981).
40. Y. Q. Wang and W. H. Weinberg, Phys. Rev. Lett. 69, 3326 (1992); Y. Q. Wang and W. H. Weinberg, Surf. Sci. 287, 1102 (1993).
41. Y. Q. Wang and W. H. Weinberg, Phys. Rev. Lett. 69, 3326 (1992); Y. Q. Wang and W. H. Weinberg, Surf. Sci. 287, 1102 (1993).
42. D. E. Aspnes, Anal. Chem. 47, 1181 (1975).
43. N. Wu, The Maximum Entropy Method (Springer, Berlin, 1997).
44. See, e.g., S. Haykin and S. Kessler, in Nonlinear Methods of Spectral Analysis, Topics in Applied Physics Vol. 34, edited by S. Haykin (Springer, Berlin, 1979); N. S. McIntyre, A. R. Pratt, H. Piao, D. Maybury, and S. J. Splinter, Appl. Surf. Sci. 144-145, 156 (1999).
45. See, e.g., S. Haykin and S. Kessler, in Nonlinear Methods of Spectral Analysis, Topics in Applied Physics Vol. 34, edited by S. Haykin (Springer, Berlin, 1979); N. S. McIntyre, A. R. Pratt, H. Piao, D. Maybury, and S. J. Splinter, Appl. Surf. Sci. 144-145, 156 (1999).
46. The cosine transform underlies the Joint Photographic Expert Group (JPEG) encoding scheme, see for example W. B. Pennebaker and J. L. Mitchell, The JPEG Still Image Data Compression Standard (Van Nostrand Reinhold, New York, 1993).
47. R. Siuda, Appl. Surf. Sci. 81, 27 (1994).
48. P. M. van Cittert, Z. Phys. 69, 298 (1931).
49. G. K. Wertheim, Rev. Sci. Instrum. 46, 1414 (1975); J. Electrochem. Spectrosc. 6, 239 (1975); P. Marchand and L. Marmet, Rev. Sci. Instrum. 54, 1034 (1983).
50. G. K. Wertheim, Rev. Sci. Instrum. 46, 1414 (1975); J. Electrochem. Spectrosc. 6, 239 (1975); P. Marchand and L. Marmet, Rev. Sci. Instrum. 54, 1034 (1983).
51. G. K. Wertheim, Rev. Sci. Instrum. 46, 1414 (1975); J. Electrochem. Spectrosc. 6, 239 (1975); P. Marchand and L. Marmet, Rev. Sci. Instrum. 54, 1034 (1983).
52. C.-M. Kao, X. Pan, P. La Riviére, and M. A. Anastasio, Opt. Eng. 38, 2041 (1999).
53. M. Prutton, D. K. Wilkerson, P. G. Kenny, and D. L. Mountain, Appl. Surf. Sci. 144-145, 1 (1999).
54. I. Podlubny, Fractional Differential Equations: An Introduction to Fractional Derivatives, Fractional Differential Equations, to Methods of Their Solution and Some of Their Applications (Academic, San Diego, 1999).
55. S. Evans, Surf. Interface Anal. 17, 85 (1991); H. P. Hughes and J. A. Scarfe, J. Phys.: Condens. Matter 8, 1421 (1996).
56. S. Evans, Surf. Interface Anal. 17, 85 (1991); H. P. Hughes and J. A. Scarfe, J. Phys.: Condens. Matter 8, 1421 (1996).
57. S. Doniach and M. Sunjic, J. Phys. C 3, 285 (1970).
58. W. Richter and N. Esser (private communication.)
59. M. P. Seah and M. T. Brown, Appl. Surf. Sci. 144-145, 183 (1999).
60. O. P. A. Lindquist, K. Järrendahl, S. Peters, J.-T. Zettler, C. Cobet, N. Esser, D. E. Aspnes, A. Henry, and N. V. Edwards, Appl. Phys. Lett. 78, 2715 (2001).