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Volumn 177, Issue 1, 2000, Pages 157-163

Characterization of AlxGa1-xN-compound layers by reflectance difference spectroscopy

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; COMPUTER SIMULATION; CRYSTAL LATTICES; CRYSTAL SYMMETRY; ENERGY GAP; INTERFACES (MATERIALS); LIGHT REFLECTION; NITRIDES; SAPPHIRE; SEMICONDUCTING ALUMINUM COMPOUNDS; SILICON CARBIDE; SPECTROSCOPY;

EID: 0033904478     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1521-396X(200001)177:1<157::AID-PSSA157>3.0.CO;2-P     Document Type: Article
Times cited : (4)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.