Reciprocal-space analysis of photoluminescence and photoluminescence excitation spectra

Applied Physics Letters

Volumn 68, Issue 23, 1996, Pages 3230-3232

  Yoo, S D ^a   Aspnes, D E ^a   Rhee, S J ^b   Woo, J C ^b  

^a NORTH CAROLINA STATE UNIVERSITY   (United States)

^b Seoul National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON TRANSITIONS; EMISSION SPECTROSCOPY; FOURIER TRANSFORMS; NUMERICAL METHODS; REGRESSION ANALYSIS; SEMICONDUCTOR QUANTUM WELLS;

BASE LINE EFFECTS; LORENTZIAN FUNCTIONS; PHOTOLUMINESCENCE EXCITATION SPECTRA; REAL SPACE ANALYSIS; RECIPROCAL SPACE ANALYSIS;

PHOTOLUMINESCENCE;

EID: 0030567649     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.116446     Document Type: Article

References (9)

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9. S. D. Yoo, D. E. Aspnes, S. J. Rhee, H. S. Ko, Y. M. Kim, and J. C. Woo, Proceedings of the 22nd International Symposium on Compound Semiconductors, 1995 (to be published).