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Volumn 144-145, Issue , 1999, Pages 1-10

Data processing for spectrum-images: Extracting information from the data mountain

Author keywords

Auger electron spectroscopy; Image processing; Metal semiconductor interfaces; Scanning electron microscopy

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; ELECTRON ENERGY LEVELS; INTERFACES (MATERIALS); ION BOMBARDMENT; METALS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR MATERIALS;

EID: 0032632532     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00754-5     Document Type: Article
Times cited : (15)

References (38)
  • 15
    • 0022085233 scopus 로고
    • L. Frank, Vacuum 36 (1986) 437.
    • (1986) Vacuum , vol.36 , pp. 437
    • Frank, L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.