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Semiconductor Science and Technology
Volumn 16, Issue 11, 2001, Pages 939-946
Monte Carlo analysis of dynamic and noise performance of submicron MOSFETs at RF and microwave frequencies
(5)
Rengel, R
a
Mateos, J
a
Pardo, D
a
Gonzalez T
a
Martin M J
a
a
UNIVERSITY OF SALAMANCA
(
Spain
)
Author keywords
[No Author keywords available]
Indexed keywords
COMPUTER SIMULATION; ELECTRIC ADMITTANCE; ELECTRON TRANSPORT PROPERTIES; FREQUENCY RESPONSE; GATES (TRANSISTOR); MONTE CARLO METHODS; SPURIOUS SIGNAL NOISE; SUBSTRATES;
BIPOLAR SIMULATORS;
MOSFET DEVICES;
EID
:
0035505855
PISSN
:
02681242
EISSN
:
None
Source Type
:
Journal
DOI
:
10.1088/0268-1242/16/11/310
Document Type
:
Article
Times cited : (
38
)
References (
32
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