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Volumn 16, Issue 11, 2001, Pages 939-946

Monte Carlo analysis of dynamic and noise performance of submicron MOSFETs at RF and microwave frequencies

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC ADMITTANCE; ELECTRON TRANSPORT PROPERTIES; FREQUENCY RESPONSE; GATES (TRANSISTOR); MONTE CARLO METHODS; SPURIOUS SIGNAL NOISE; SUBSTRATES;

EID: 0035505855     PISSN: 02681242     EISSN: None     Source Type: Journal    
DOI: 10.1088/0268-1242/16/11/310     Document Type: Article
Times cited : (38)

References (32)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.