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Volumn 45, Issue 8, 1998, Pages 1769-1775

Extraction of High-Frequency equivalent circuit parameters of submicron gate-length mosfet's

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; COMPUTER SIMULATION; ELECTRIC RESISTANCE; EQUIVALENT CIRCUITS; IMPEDANCE MATCHING (ELECTRIC);

EID: 0032140536     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.704377     Document Type: Article
Times cited : (55)

References (15)
  • 1
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    • Burns, J.R.1
  • 2
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    • High-frequency network properties of MOS transistors including the substrate resistivity effects
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  • 3
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    • Modeling of the MOS transistor for high frequency analog design
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    • P. J. V. Vandeloo, "Modeling of the MOS transistor for high frequency analog design," IEEE Trans. Computer-Aided Design, vol. 7, pp. 713-722, July 1989.
    • (1989) IEEE Trans. Computer-Aided Design , vol.7 , pp. 713-722
    • Vandeloo, P.J.V.1
  • 4
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    • SPICE2: A computer program to simulate semiconductor circuits
    • Univ. of California, Berkeley
    • L. W. Nagel, "SPICE2: A computer program to simulate semiconductor circuits," Memo. ERL-M520, Univ. of California, Berkeley, 1975.
    • (1975) Memo. ERL-M520
    • Nagel, L.W.1
  • 5
    • 0025416459 scopus 로고
    • Determination of equivalent network parameters of short-gate-length modulation-doped field-effect transistors
    • S. T. Fu, S. M. J. Liu, and M. B. Das, "Determination of equivalent network parameters of short-gate-length modulation-doped field-effect transistors," IEEE Trans. Electron Devices, vol. 37, pp. 888-901, 1990.
    • (1990) IEEE Trans. Electron Devices , vol.37 , pp. 888-901
    • Fu, S.T.1    Liu, S.M.J.2    Das, M.B.3
  • 6
    • 33747195710 scopus 로고    scopus 로고
    • Extraction of dynamic characteristics of 2-D electron gas in heterostructure field-effect transistors
    • Washington, DC: AIP, 1996
    • R. Sung and M. B. Das, "Extraction of dynamic characteristics of 2-D electron gas in heterostructure field-effect transistors," Semiconductor Characterization: Present Status and Future Needs. Washington, DC: AIP, 1996, pp. 693-697.
    • Semiconductor Characterization: Present Status and Future Needs , pp. 693-697
    • Sung, R.1    Das, M.B.2
  • 7
    • 84939769577 scopus 로고
    • MOSFET equivalent circuit at pinchoff
    • Sept.
    • D. H. Treleaven and F. N. Trofimenkoff, "MOSFET equivalent circuit at pinchoff," Proc. IEEE, vol. 54, pp. 1223-1224, Sept. 1966.
    • (1966) Proc. IEEE , vol.54 , pp. 1223-1224
    • Treleaven, D.H.1    Trofimenkoff, F.N.2
  • 8
    • 0008431563 scopus 로고
    • A high-frequency representation of the MOS transistor
    • Dec.
    • H. Johnson, "A high-frequency representation of the MOS transistor," Proc. IEEE Lett., vol. 54, pp. 1970-1971, Dec. 1966.
    • (1966) Proc. IEEE Lett. , vol.54 , pp. 1970-1971
    • Johnson, H.1
  • 9
    • 33747151487 scopus 로고
    • Generalized high-frequency network theory of field-effect transistors
    • Jan.
    • M. B. Das, "Generalized high-frequency network theory of field-effect transistors," Proc. IEE, vol. 114, pp. 50-59, Jan. 1967.
    • (1967) Proc. IEE , vol.114 , pp. 50-59
    • Das, M.B.1
  • 10
    • 0024048518 scopus 로고
    • A new method for determining the FET small-signal equivalent circuit
    • June
    • G. Dambrine, A. Cappy, F. Heliodore, and E. Playez, "A new method for determining the FET small-signal equivalent circuit," IEEE Trans. Microwave Theory Tech., vol. 36, pp. 1151-1159, June 1988.
    • (1988) IEEE Trans. Microwave Theory Tech. , vol.36 , pp. 1151-1159
    • Dambrine, G.1    Cappy, A.2    Heliodore, F.3    Playez, E.4
  • 12
    • 33747176411 scopus 로고
    • FET high-frequency analysis
    • Nov. also see D. H. Treleaven and F. N. Trofimenkoff, MOSFET equivalent circuit at pinchoff, Proc. IEEE, vol. 54, pp. 1223-1224, Sept. 1966.
    • B. Redley and F. N. Trufimenkoff, "FET high-frequency analysis," Proc. IEE, vol. 113, pp. 1755-1762, Nov. 1966, also see D. H. Treleaven and F. N. Trofimenkoff, "MOSFET equivalent circuit at pinchoff," Proc. IEEE, vol. 54, pp. 1223-1224, Sept. 1966.
    • (1966) Proc. IEE , vol.113 , pp. 1755-1762
    • Redley, B.1    Trufimenkoff, F.N.2
  • 13
    • 0011153095 scopus 로고
    • HEMT device physics and models
    • F. Ali and A. Gupta, Eds. Norwood, MA: Artech House, ch.
    • M. B. Das, "HEMT device physics and models," in HEMT's and HBT's: Devices, Fabrication, and Circuits, F. Ali and A. Gupta, Eds. Norwood, MA: Artech House, ch. 2, pp. 11-75, 1991.
    • (1991) HEMT's and HBT's: Devices, Fabrication, and Circuits , vol.2 , pp. 11-75
    • Das, M.B.1
  • 14
    • 0023385057 scopus 로고
    • Millimeter-wave performance of ultrasubmicrometer-gate fieldeffect transistors: A comparison of MODFET, MESFET, and PBT structures
    • July
    • Millimeter-wave performance of ultrasubmicrometer-gate fieldeffect transistors: A comparison of MODFET, MESFET, and PBT structures," IEEE Trans. Electron Devices, vol. ED-34, p. 1429, July 1987.
    • (1987) IEEE Trans. Electron Devices, Vol. ED , vol.34 , pp. 1429


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.