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Volumn 490, Issue 1-2, 2001, Pages 76-84

Surface charge compensation and ferroelectric domain structure of triglycine sulfate revealed by voltage-modulated scanning force microscopy

(5) Likodimos, V a,c Labardi, M a Allegrini, M a Garcia, N b Osipov, V V b

a UNIVERSITY OF PISA (Italy)

b CSIC (Spain)

c INSTITUTE OF MATERIALS SCIENCE (Greece)

Author keywords

Atomic force microscopy; Dielectric phenomena; Single crystal surfaces; Surface relaxation and reconstruction; Surface structure, morphology, roughness, and topography

Indexed keywords

CONDENSATION; CONDUCTIVE FILMS; ELECTRIC POTENTIAL; IMAGING TECHNIQUES; MICROSCOPIC EXAMINATION; SINGLE CRYSTALS; SURFACE STRUCTURE;

VOLTAGE-MODULATED SCANNING FORCE MICROSCOPY;

FERROELECTRIC MATERIALS;

EID: 0035451907 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/S0039-6028(01)01227-4 Document Type: Article

Times cited : (13)

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