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Volumn 82, Issue 1-4, 2000, Pages 149-152

AFM characterization of domain structure of ferroelectric TGS crystals on a nanoscale

Author keywords

Atomic force microscopy; Domains; Ferroelectrics

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; CRYSTAL GROWTH; CRYSTAL STRUCTURE; SULFUR COMPOUNDS; SURFACE TOPOGRAPHY;

EID: 0033959558     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(99)00147-3     Document Type: Article
Times cited : (13)

References (4)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.