Surface morphology, chemical contrast, and ferroelectric domains in TGS bulk single crystals differentiated with UHV non-contact force microscopy

Applied Surface Science

Volumn 140, Issue 3-4, 1999, Pages 253-258

  Eng, L M ^a   Bammerlin, M ^a   Loppacher, Ch ^a   Guggisberg, M ^a   Bennewitz, R ^a   Luthi R ^b   Meyer, E ^a   Guntherodt H J ^a  

^a UNIVERSITY OF BASEL   (Switzerland)

^b IBM   (Switzerland)

Author keywords

07.79.Lh; 77.80.Dj; 77.84.Jd; 77.90.+k; 81.70. q; APN; Atomic resolution; Chemical contrast; Ferroelectric domains and domain walls; Non contact force microscopy

Indexed keywords

EID: 0000400335     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00536-4     Document Type: Article

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