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Volumn 184, Issue 1-4, 1996, Pages 1-10
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Observation of ferroelectric domain structure branching and large step mobility on the tgs surface by atomic force and snom microscopy
a a a a,b a,c a |
Author keywords
[No Author keywords available]
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Indexed keywords
ARGON;
ATOMIC FORCE MICROSCOPY;
GAS LASERS;
OPTICAL MICROSCOPY;
PIEZOELECTRICITY;
SURFACE STRUCTURE;
ARGON LASERS;
FERROELECTRIC DOMAIN STRUCTURE BRANCHING;
LARGE STEP MOBILITY;
PARAELECTRIC PHASE;
PIEZOELECTRIC DRIFTS;
SCANNING NEAR FIELD OPTICAL MICROSCOPY;
FERROELECTRIC MATERIALS;
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EID: 0030370479
PISSN: 00150193
EISSN: None
Source Type: Journal
DOI: 10.1080/00150199608230239 Document Type: Article |
Times cited : (9)
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References (22)
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