Morphology and surface relief structures of asymmetric poly(styrene-block-ferrocenylsilane) thin films

Macromolecules

Volumn 34, Issue 4, 2001, Pages 942-950

  Lammertink, Rob G H ^a   Hempenius, Mark A ^a   Vancso, G Julius ^a   Shin, Kwanwoo ^b   Rafailovich, Miriam H ^b   Sokolov, Jonathan ^b  

^a UNIVERSITY OF TWENTE   (Netherlands)

^b Stony Brook University   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

BLOCK COPOLYMERS; MORPHOLOGY; OPTICAL MICROSCOPY; PHASE SEPARATION; POLYSILANES; POLYSTYRENES; REACTIVE ION ETCHING; SECONDARY ION MASS SPECTROMETRY; TRANSMISSION ELECTRON MICROSCOPY; X RAY ANALYSIS;

SURFACE RELIEF STRUCTURES; X RAY REFLECTIVITY;

PLASTIC FILMS;

EID: 0035250763     PISSN: 00249297     EISSN: None     Source Type: Journal    
DOI: 10.1021/ma000559j     Document Type: Article

References (72)

1. Lambooy, P.; Russell, T. P.; Kellogg, G. J.; Mayes, A. M.; Gallagher, P. D.; Satija, S. K. Phys. Rev. Lett. 1994, 72, 2899.
2. Koneripalli, N.; Singh, N.; Levicky, R.; Bates, F. S.; Gallagher, P. D.; Satija, S. K. Macromolecules 1995, 28, 2897.
3. Koneripalli, N.; Levicky, R.; Bates, F. S.; Ankner, J.; Kaiser, H.; Satija, S. K. Langmuir 1996, 12, 6681.
4. Kellogg, G. J.; Walton, D. G.; Mayes, A. M.; Lambooy, P.; Russell, T. P.; Gallagher, P. D.; Satija, S. K. Phys. Rev. Lett. 1996, 76, 2503.
5. Walton, D. G.; Kellogg, G. J.; Mayes, A. M.; Lambooy, P.; Russell, T. P. Macromolecules 1994, 27, 6225.
6. Pickett, G. T.; Balazs, A. C. Macromolecules 1997, 30, 3097.
7. Matsen, M. W. J. Chem. Phys. 1997, 106, 7781.
8. (a) Kikuchi, M.; Binder, K. Europhys. Lett. 1993, 21, 427.
9. (b) Kikuchi, M.; Binder, K. J. Chem. Phys. 1994, 101, 3367.
10. Coulon, G.; Auserre, D.; Russell, T. P. J. Phys. (Paris) 1990, 51, 777.
11. Surface-induced ordering in thin films has been studied by several techniques, such as neutron reflectivity, secondary ion mass spectroscopy (SIMS), and transmission electron microscopy (TEM). (a) Anastasiadis, S. H.; Russell, T. P.; Satija, S. K.; Majkrzak, C. F. Phys. Rev. Lett. 1989, 62, 1852. (b) Anastasiadis, S. H.; Russell, T. P.; Satija, S. K.; Majkrzak, C. F. J. Chem. Phys. 1990, 92, 5677. (c) Menelle, A.; Russell, T. P.; Anastasiadis, S. H.; Satija, S. K.; Majkrzak, C. F. Phys. Rev. Lett. 1992, 68, 67. (d) Mayes, A. M.; Russell, T. P.; Bassereau, P.; Baker, S. M.; Smith, G. S. Macromolecules 1994, 27, 749. (e) Gadegaard, N.; Almdal, K.; Larsen, N. B.; Mortensen, K. Appl. Surf. Sci. 1999, 142, 608. A selection of papers on thin block copolymer films that have been studied by SIMS: (f) Coulon, G.; Russell, T. P.; Deline, V. R.; Green, P. F. Macromolecules 1989, 22, 2581. (g) Russell, T. P.; Coulon, G.; Deline, V. R.; Miller, D. C. Macromolecules 1989, 22, 4600. TEM can be used to elucidate the morphology within thin films: (h) Carvalho, B. L.; Thomas, E. L. Phys. Rev. Lett. 1994, 73, 3321. (i) Carvalho, B. L.; Lescanec, R. L.; Thomas, E. L. Macromol. Symp. 1995, 98, 1131. (j) Liu, Y.; Rafailovich, M. H.; Sokolov, J.; Schwarz, S. A.; Bahal, S. Macromolecules 1996, 29, 899.
12. Surface-induced ordering in thin films has been studied by several techniques, such as neutron reflectivity, secondary ion mass spectroscopy (SIMS), and transmission electron microscopy (TEM). (a) Anastasiadis, S. H.; Russell, T. P.; Satija, S. K.; Majkrzak, C. F. Phys. Rev. Lett. 1989, 62, 1852. (b) Anastasiadis, S. H.; Russell, T. P.; Satija, S. K.; Majkrzak, C. F. J. Chem. Phys. 1990, 92, 5677. (c) Menelle, A.; Russell, T. P.; Anastasiadis, S. H.; Satija, S. K.; Majkrzak, C. F. Phys. Rev. Lett. 1992, 68, 67. (d) Mayes, A. M.; Russell, T. P.; Bassereau, P.; Baker, S. M.; Smith, G. S. Macromolecules 1994, 27, 749. (e) Gadegaard, N.; Almdal, K.; Larsen, N. B.; Mortensen, K. Appl. Surf. Sci. 1999, 142, 608. A selection of papers on thin block copolymer films that have been studied by SIMS: (f) Coulon, G.; Russell, T. P.; Deline, V. R.; Green, P. F. Macromolecules 1989, 22, 2581. (g) Russell, T. P.; Coulon, G.; Deline, V. R.; Miller, D. C. Macromolecules 1989, 22, 4600. TEM can be used to elucidate the morphology within thin films: (h) Carvalho, B. L.; Thomas, E. L. Phys. Rev. Lett. 1994, 73, 3321. (i) Carvalho, B. L.; Lescanec, R. L.; Thomas, E. L. Macromol. Symp. 1995, 98, 1131. (j) Liu, Y.; Rafailovich, M. H.; Sokolov, J.; Schwarz, S. A.; Bahal, S. Macromolecules 1996, 29, 899.
13. Surface-induced ordering in thin films has been studied by several techniques, such as neutron reflectivity, secondary ion mass spectroscopy (SIMS), and transmission electron microscopy (TEM). (a) Anastasiadis, S. H.; Russell, T. P.; Satija, S. K.; Majkrzak, C. F. Phys. Rev. Lett. 1989, 62, 1852. (b) Anastasiadis, S. H.; Russell, T. P.; Satija, S. K.; Majkrzak, C. F. J. Chem. Phys. 1990, 92, 5677. (c) Menelle, A.; Russell, T. P.; Anastasiadis, S. H.; Satija, S. K.; Majkrzak, C. F. Phys. Rev. Lett. 1992, 68, 67. (d) Mayes, A. M.; Russell, T. P.; Bassereau, P.; Baker, S. M.; Smith, G. S. Macromolecules 1994, 27, 749. (e) Gadegaard, N.; Almdal, K.; Larsen, N. B.; Mortensen, K. Appl. Surf. Sci. 1999, 142, 608. A selection of papers on thin block copolymer films that have been studied by SIMS: (f) Coulon, G.; Russell, T. P.; Deline, V. R.; Green, P. F. Macromolecules 1989, 22, 2581. (g) Russell, T. P.; Coulon, G.; Deline, V. R.; Miller, D. C. Macromolecules 1989, 22, 4600. TEM can be used to elucidate the morphology within thin films: (h) Carvalho, B. L.; Thomas, E. L. Phys. Rev. Lett. 1994, 73, 3321. (i) Carvalho, B. L.; Lescanec, R. L.; Thomas, E. L. Macromol. Symp. 1995, 98, 1131. (j) Liu, Y.; Rafailovich, M. H.; Sokolov, J.; Schwarz, S. A.; Bahal, S. Macromolecules 1996, 29, 899.
14. Surface-induced ordering in thin films has been studied by several techniques, such as neutron reflectivity, secondary ion mass spectroscopy (SIMS), and transmission electron microscopy (TEM). (a) Anastasiadis, S. H.; Russell, T. P.; Satija, S. K.; Majkrzak, C. F. Phys. Rev. Lett. 1989, 62, 1852. (b) Anastasiadis, S. H.; Russell, T. P.; Satija, S. K.; Majkrzak, C. F. J. Chem. Phys. 1990, 92, 5677. (c) Menelle, A.; Russell, T. P.; Anastasiadis, S. H.; Satija, S. K.; Majkrzak, C. F. Phys. Rev. Lett. 1992, 68, 67. (d) Mayes, A. M.; Russell, T. P.; Bassereau, P.; Baker, S. M.; Smith, G. S. Macromolecules 1994, 27, 749. (e) Gadegaard, N.; Almdal, K.; Larsen, N. B.; Mortensen, K. Appl. Surf. Sci. 1999, 142, 608. A selection of papers on thin block copolymer films that have been studied by SIMS: (f) Coulon, G.; Russell, T. P.; Deline, V. R.; Green, P. F. Macromolecules 1989, 22, 2581. (g) Russell, T. P.; Coulon, G.; Deline, V. R.; Miller, D. C. Macromolecules 1989, 22, 4600. TEM can be used to elucidate the morphology within thin films: (h) Carvalho, B. L.; Thomas, E. L. Phys. Rev. Lett. 1994, 73, 3321. (i) Carvalho, B. L.; Lescanec, R. L.; Thomas, E. L. Macromol. Symp. 1995, 98, 1131. (j) Liu, Y.; Rafailovich, M. H.; Sokolov, J.; Schwarz, S. A.; Bahal, S. Macromolecules 1996, 29, 899.
15. Surface-induced ordering in thin films has been studied by several techniques, such as neutron reflectivity, secondary ion mass spectroscopy (SIMS), and transmission electron microscopy (TEM). (a) Anastasiadis, S. H.; Russell, T. P.; Satija, S. K.; Majkrzak, C. F. Phys. Rev. Lett. 1989, 62, 1852. (b) Anastasiadis, S. H.; Russell, T. P.; Satija, S. K.; Majkrzak, C. F. J. Chem. Phys. 1990, 92, 5677. (c) Menelle, A.; Russell, T. P.; Anastasiadis, S. H.; Satija, S. K.; Majkrzak, C. F. Phys. Rev. Lett. 1992, 68, 67. (d) Mayes, A. M.; Russell, T. P.; Bassereau, P.; Baker, S. M.; Smith, G. S. Macromolecules 1994, 27, 749. (e) Gadegaard, N.; Almdal, K.; Larsen, N. B.; Mortensen, K. Appl. Surf. Sci. 1999, 142, 608. A selection of papers on thin block copolymer films that have been studied by SIMS: (f) Coulon, G.; Russell, T. P.; Deline, V. R.; Green, P. F. Macromolecules 1989, 22, 2581. (g) Russell, T. P.; Coulon, G.; Deline, V. R.; Miller, D. C. Macromolecules 1989, 22, 4600. TEM can be used to elucidate the morphology within thin films: (h) Carvalho, B. L.; Thomas, E. L. Phys. Rev. Lett. 1994, 73, 3321. (i) Carvalho, B. L.; Lescanec, R. L.; Thomas, E. L. Macromol. Symp. 1995, 98, 1131. (j) Liu, Y.; Rafailovich, M. H.; Sokolov, J.; Schwarz, S. A.; Bahal, S. Macromolecules 1996, 29, 899.
16. Surface-induced ordering in thin films has been studied by several techniques, such as neutron reflectivity, secondary ion mass spectroscopy (SIMS), and transmission electron microscopy (TEM). (a) Anastasiadis, S. H.; Russell, T. P.; Satija, S. K.; Majkrzak, C. F. Phys. Rev. Lett. 1989, 62, 1852. (b) Anastasiadis, S. H.; Russell, T. P.; Satija, S. K.; Majkrzak, C. F. J. Chem. Phys. 1990, 92, 5677. (c) Menelle, A.; Russell, T. P.; Anastasiadis, S. H.; Satija, S. K.; Majkrzak, C. F. Phys. Rev. Lett. 1992, 68, 67. (d) Mayes, A. M.; Russell, T. P.; Bassereau, P.; Baker, S. M.; Smith, G. S. Macromolecules 1994, 27, 749. (e) Gadegaard, N.; Almdal, K.; Larsen, N. B.; Mortensen, K. Appl. Surf. Sci. 1999, 142, 608. A selection of papers on thin block copolymer films that have been studied by SIMS: (f) Coulon, G.; Russell, T. P.; Deline, V. R.; Green, P. F. Macromolecules 1989, 22, 2581. (g) Russell, T. P.; Coulon, G.; Deline, V. R.; Miller, D. C. Macromolecules 1989, 22, 4600. TEM can be used to elucidate the morphology within thin films: (h) Carvalho, B. L.; Thomas, E. L. Phys. Rev. Lett. 1994, 73, 3321. (i) Carvalho, B. L.; Lescanec, R. L.; Thomas, E. L. Macromol. Symp. 1995, 98, 1131. (j) Liu, Y.; Rafailovich, M. H.; Sokolov, J.; Schwarz, S. A.; Bahal, S. Macromolecules 1996, 29, 899.
17. Surface-induced ordering in thin films has been studied by several techniques, such as neutron reflectivity, secondary ion mass spectroscopy (SIMS), and transmission electron microscopy (TEM). (a) Anastasiadis, S. H.; Russell, T. P.; Satija, S. K.; Majkrzak, C. F. Phys. Rev. Lett. 1989, 62, 1852. (b) Anastasiadis, S. H.; Russell, T. P.; Satija, S. K.; Majkrzak, C. F. J. Chem. Phys. 1990, 92, 5677. (c) Menelle, A.; Russell, T. P.; Anastasiadis, S. H.; Satija, S. K.; Majkrzak, C. F. Phys. Rev. Lett. 1992, 68, 67. (d) Mayes, A. M.; Russell, T. P.; Bassereau, P.; Baker, S. M.; Smith, G. S. Macromolecules 1994, 27, 749. (e) Gadegaard, N.; Almdal, K.; Larsen, N. B.; Mortensen, K. Appl. Surf. Sci. 1999, 142, 608. A selection of papers on thin block copolymer films that have been studied by SIMS: (f) Coulon, G.; Russell, T. P.; Deline, V. R.; Green, P. F. Macromolecules 1989, 22, 2581. (g) Russell, T. P.; Coulon, G.; Deline, V. R.; Miller, D. C. Macromolecules 1989, 22, 4600. TEM can be used to elucidate the morphology within thin films: (h) Carvalho, B. L.; Thomas, E. L. Phys. Rev. Lett. 1994, 73, 3321. (i) Carvalho, B. L.; Lescanec, R. L.; Thomas, E. L. Macromol. Symp. 1995, 98, 1131. (j) Liu, Y.; Rafailovich, M. H.; Sokolov, J.; Schwarz, S. A.; Bahal, S. Macromolecules 1996, 29, 899.
18. Surface-induced ordering in thin films has been studied by several techniques, such as neutron reflectivity, secondary ion mass spectroscopy (SIMS), and transmission electron microscopy (TEM). (a) Anastasiadis, S. H.; Russell, T. P.; Satija, S. K.; Majkrzak, C. F. Phys. Rev. Lett. 1989, 62, 1852. (b) Anastasiadis, S. H.; Russell, T. P.; Satija, S. K.; Majkrzak, C. F. J. Chem. Phys. 1990, 92, 5677. (c) Menelle, A.; Russell, T. P.; Anastasiadis, S. H.; Satija, S. K.; Majkrzak, C. F. Phys. Rev. Lett. 1992, 68, 67. (d) Mayes, A. M.; Russell, T. P.; Bassereau, P.; Baker, S. M.; Smith, G. S. Macromolecules 1994, 27, 749. (e) Gadegaard, N.; Almdal, K.; Larsen, N. B.; Mortensen, K. Appl. Surf. Sci. 1999, 142, 608. A selection of papers on thin block copolymer films that have been studied by SIMS: (f) Coulon, G.; Russell, T. P.; Deline, V. R.; Green, P. F. Macromolecules 1989, 22, 2581. (g) Russell, T. P.; Coulon, G.; Deline, V. R.; Miller, D. C. Macromolecules 1989, 22, 4600. TEM can be used to elucidate the morphology within thin films: (h) Carvalho, B. L.; Thomas, E. L. Phys. Rev. Lett. 1994, 73, 3321. (i) Carvalho, B. L.; Lescanec, R. L.; Thomas, E. L. Macromol. Symp. 1995, 98, 1131. (j) Liu, Y.; Rafailovich, M. H.; Sokolov, J.; Schwarz, S. A.; Bahal, S. Macromolecules 1996, 29, 899.
19. Surface-induced ordering in thin films has been studied by several techniques, such as neutron reflectivity, secondary ion mass spectroscopy (SIMS), and transmission electron microscopy (TEM). (a) Anastasiadis, S. H.; Russell, T. P.; Satija, S. K.; Majkrzak, C. F. Phys. Rev. Lett. 1989, 62, 1852. (b) Anastasiadis, S. H.; Russell, T. P.; Satija, S. K.; Majkrzak, C. F. J. Chem. Phys. 1990, 92, 5677. (c) Menelle, A.; Russell, T. P.; Anastasiadis, S. H.; Satija, S. K.; Majkrzak, C. F. Phys. Rev. Lett. 1992, 68, 67. (d) Mayes, A. M.; Russell, T. P.; Bassereau, P.; Baker, S. M.; Smith, G. S. Macromolecules 1994, 27, 749. (e) Gadegaard, N.; Almdal, K.; Larsen, N. B.; Mortensen, K. Appl. Surf. Sci. 1999, 142, 608. A selection of papers on thin block copolymer films that have been studied by SIMS: (f) Coulon, G.; Russell, T. P.; Deline, V. R.; Green, P. F. Macromolecules 1989, 22, 2581. (g) Russell, T. P.; Coulon, G.; Deline, V. R.; Miller, D. C. Macromolecules 1989, 22, 4600. TEM can be used to elucidate the morphology within thin films: (h) Carvalho, B. L.; Thomas, E. L. Phys. Rev. Lett. 1994, 73, 3321. (i) Carvalho, B. L.; Lescanec, R. L.; Thomas, E. L. Macromol. Symp. 1995, 98, 1131. (j) Liu, Y.; Rafailovich, M. H.; Sokolov, J.; Schwarz, S. A.; Bahal, S. Macromolecules 1996, 29, 899.
20. Surface-induced ordering in thin films has been studied by several techniques, such as neutron reflectivity, secondary ion mass spectroscopy (SIMS), and transmission electron microscopy (TEM). (a) Anastasiadis, S. H.; Russell, T. P.; Satija, S. K.; Majkrzak, C. F. Phys. Rev. Lett. 1989, 62, 1852. (b) Anastasiadis, S. H.; Russell, T. P.; Satija, S. K.; Majkrzak, C. F. J. Chem. Phys. 1990, 92, 5677. (c) Menelle, A.; Russell, T. P.; Anastasiadis, S. H.; Satija, S. K.; Majkrzak, C. F. Phys. Rev. Lett. 1992, 68, 67. (d) Mayes, A. M.; Russell, T. P.; Bassereau, P.; Baker, S. M.; Smith, G. S. Macromolecules 1994, 27, 749. (e) Gadegaard, N.; Almdal, K.; Larsen, N. B.; Mortensen, K. Appl. Surf. Sci. 1999, 142, 608. A selection of papers on thin block copolymer films that have been studied by SIMS: (f) Coulon, G.; Russell, T. P.; Deline, V. R.; Green, P. F. Macromolecules 1989, 22, 2581. (g) Russell, T. P.; Coulon, G.; Deline, V. R.; Miller, D. C. Macromolecules 1989, 22, 4600. TEM can be used to elucidate the morphology within thin films: (h) Carvalho, B. L.; Thomas, E. L. Phys. Rev. Lett. 1994, 73, 3321. (i) Carvalho, B. L.; Lescanec, R. L.; Thomas, E. L. Macromol. Symp. 1995, 98, 1131. (j) Liu, Y.; Rafailovich, M. H.; Sokolov, J.; Schwarz, S. A.; Bahal, S. Macromolecules 1996, 29, 899.
21. (a) Mansky, P.; Russell, T. P.; Hawker, C. J.; Pitsikalis, M.; Mays, J. Macromolecules 1997, 30, 6810.
22. (b) Mansky, P.; Russell, T. P.; Hawker, C. J.; Mays, J.; Cook, D. C.; Satija, S. K. Phys. Rev. Lett. 1997, 79, 237.
23. (a) Foster, M. D.; Sikka, M.; Singh, N.; Bates, F. S.; Satija, S. K.; Majkrzak, C. F. J. Chem. Phys. 1992, 96, 8605.
24. (b) Sikka, M.; Singh, N.; Karim, A.; Bates, F. S.; Satija, S. K.; Majkrzak, C. F. Phys. Rev. Lett. 1993, 70, 307.
25. A theoretical analysis of blends of stiff and flexible chains agreed with the experimental observations that the surface is enriched by the more flexible chain: Frederickson, G. H.; Donley, J. P. J. Chem. Phys. 1992, 97, 8941. However, simulations have pointed out that surface segregation can be entropy driven, resulting in surface enrichment by the suffer polymer: (a) Yethiraj, A.; Kumar, S.; Hariharan, A.; Schweizer, K. S. J. Chem. Phys. 1994, 100, 4691. (b) Kumar, S. K.; Yethiraj, A.; Schweizer, K. S.; Leermakers, F. A. M. J. Chem. Phys. 1995, 103, 10332. (c) Yethiraj, A. Phys. Rev. Lett. 1995, 74, 2018.
26. A theoretical analysis of blends of stiff and flexible chains agreed with the experimental observations that the surface is enriched by the more flexible chain: Frederickson, G. H.; Donley, J. P. J. Chem. Phys. 1992, 97, 8941. However, simulations have pointed out that surface segregation can be entropy driven, resulting in surface enrichment by the suffer polymer: (a) Yethiraj, A.; Kumar, S.; Hariharan, A.; Schweizer, K. S. J. Chem. Phys. 1994, 100, 4691. (b) Kumar, S. K.; Yethiraj, A.; Schweizer, K. S.; Leermakers, F. A. M. J. Chem. Phys. 1995, 103, 10332. (c) Yethiraj, A. Phys. Rev. Lett. 1995, 74, 2018.
27. A theoretical analysis of blends of stiff and flexible chains agreed with the experimental observations that the surface is enriched by the more flexible chain: Frederickson, G. H.; Donley, J. P. J. Chem. Phys. 1992, 97, 8941. However, simulations have pointed out that surface segregation can be entropy driven, resulting in surface enrichment by the suffer polymer: (a) Yethiraj, A.; Kumar, S.; Hariharan, A.; Schweizer, K. S. J. Chem. Phys. 1994, 100, 4691. (b) Kumar, S. K.; Yethiraj, A.; Schweizer, K. S.; Leermakers, F. A. M. J. Chem. Phys. 1995, 103, 10332. (c) Yethiraj, A. Phys. Rev. Lett. 1995, 74, 2018.
28. A theoretical analysis of blends of stiff and flexible chains agreed with the experimental observations that the surface is enriched by the more flexible chain: Frederickson, G. H.; Donley, J. P. J. Chem. Phys. 1992, 97, 8941. However, simulations have pointed out that surface segregation can be entropy driven, resulting in surface enrichment by the suffer polymer: (a) Yethiraj, A.; Kumar, S.; Hariharan, A.; Schweizer, K. S. J. Chem. Phys. 1994, 100, 4691. (b) Kumar, S. K.; Yethiraj, A.; Schweizer, K. S.; Leermakers, F. A. M. J. Chem. Phys. 1995, 103, 10332. (c) Yethiraj, A. Phys. Rev. Lett. 1995, 74, 2018.
29. (a) Coulon, G.; Collin, B.; Ausserre, D.; Chatenay, D.; Russell, T. P. J. Phys. (Paris) 1990, 51, 2801.
30. (b) Maaloum, M.; Ausserre, D.; Chatenay, D.; Coulon, G.; Gallot, Y. Phys. Rev. Lett. 1992, 68, 1575.
31. (c) Collin, B.; Chatenay, D.; Coulon, G.; Ausserre, D.; Gallot, Y. Macromolecules 1992, 25, 1621.
32. (d) Cai, Z.; Huang, K.; Montano, P. A.; Russell, T. P.; Bai, J. M.; Zajac, G. W. J. Chem. Phys. 1993, 98, 2376.
33. (e) Mutter, R.; Stühn, B. Macromolecules 1995, 28, 5022.
34. (f) Grim, P. C. M.; Nyrkova, I. A.; Semenov, A. N.; ten Brinke, G.; Hadziioannou, G. Macromolecules 1995, 28, 7501.
35. (g) Vignaud, G.; Gibaud, A.; Grübel, G.; Joly, S.; Ausserre, D.; Legrand, J. F.; Gallot, Y. Phys. B 1998, 248, 250.
36. (h) Heier, J.; Sivaniah, E.; Kramer, E. J. Macromolecules 1999, 32, 9007.
37. Rastogi, A. K.; St. Pierre, L. E. J. Colloid Interface Sci. 1969, 31, 168.
38. Liu, Y.; Rafailovich, M. H.; Sokolov, J.; Schwarz, S. A.; Bahal, S. Macromolecules 1996, 29, 899.
39. Huinink, H. P.; Brokken-Zijp, J. C. M.; van Dijk, M. A.; Sevink, G. J. A. J. Chem. Phys. 2000, 112, 2452.
40. Turner, M. S.; Rubinstein, M.; Marques. C. M. Macromolecules 1994, 27, 4986.
41. Brown, G.; Chakrabarti, A. J. Chem. Phys. 1994, 101, 3310.
42. Suh, K. Y.; Kim, Y. S.; Lee, H. H. J. Chem. Phys. 1998, 108, 1253.
43. Radzilowski, L. H.; Carvalho, B. L.; Thomas, E. L. J. Polym. Sci., Part B: Polym. Phys. 1996, 34, 3081.
44. Yokoyama, H.; Kramer, E. J.; Rafailovich, M. H.; Sokolov, J.; Schwarz, S. A. Macromolecules 1998, 31, 8826.
45. Liu, Y.; Zhao, W.; Zheng, X.; King, A.; Singh, A.; Rafailovich, M. H.; Sokolov, J.; Dai, K. H.; Kramer, E. J.; Schwarz, S. A.; Gebizlioglu, O.; Sinha, S. K. Macromolecules 1994, 27, 4000.
46. (a) Karim, A.; Singh, N.; Sikka, M.; Bates, F. S.; Dozier, W. D.; Felcher, G. P. J. Chem. Phys. 1994, 100, 1620.
47. (b) Henkee, C. S.; Thomas, E. L.; Fetters, L. J. J. Mater. Sci. 1988, 23, 1685.
48. Yokoyama, H.; Mates, T. E.; Kramer, E. J. Macromolecules 2000, 33, 1888.
49. For anionic polymerization of ferrocenophanes see for example: (a) Rulkens, R.; Lough, A. J.; Manners, I. J. Am. Chem. Soc. 1994, 116, 797. (b) Ni, Y. Z.; Rulkens, R.; Manners, I. J. Am. Chem. Soc. 1996, 118, 4102. For a review on poly(ferrocenylsilanes) see: (c) Manners, I. Chem. Commun. 1999, 857.
50. For anionic polymerization of ferrocenophanes see for example: (a) Rulkens, R.; Lough, A. J.; Manners, I. J. Am. Chem. Soc. 1994, 116, 797. (b) Ni, Y. Z.; Rulkens, R.; Manners, I. J. Am. Chem. Soc. 1996, 118, 4102. For a review on poly(ferrocenylsilanes) see: (c) Manners, I. Chem. Commun. 1999, 857.
51. For anionic polymerization of ferrocenophanes see for example: (a) Rulkens, R.; Lough, A. J.; Manners, I. J. Am. Chem. Soc. 1994, 116, 797. (b) Ni, Y. Z.; Rulkens, R.; Manners, I. J. Am. Chem. Soc. 1996, 118, 4102. For a review on poly(ferrocenylsilanes) see: (c) Manners, I. Chem. Commun. 1999, 857.
52. Lammertink, R. G. H.; Hempenius, M. A.; Thomas, E. L.; Vancso, G. J. J. Polym. Sci., Part B: Polym. Phys. 1999, 37, 1009.
53. Spatz, J. P.; Sheiko, S.; Möller, M. Adv. Mater. 1996, 8, 513.
54. Park, M.; Harrison, C.; Chaikin, P. M.; Register, R. A.; Adamson, D. H. Science 1997, 276, 1401.
55. (a) Lammertink, R. G. H.; Hempenius, M. A.; van den Enk, J. E.; Chan, V. Z.-H.; Thomas, E. L.; Vancso, G. J. Adv. Mater. 2000, 12, 98.
56. (b) Lammertink, R. G. H.; Hempenius, M. A.; Vancso, G. J.; Chan, V. Z.-H.; Thomas, E. L. Abstract ACS, PMSE Prepr. 1999, 81, 14.
57. Lammertink, R. G. H.; Hempenius, M. A.; Vancso, G. J. Chem. Mater., in press.
58. Lammertink, R. G. H.; Hempenius, M. A.; Manners, I.; Vancso, G. J. Macromolecules 1998, 31, 795.
59. The contact angles of liquids with the poly(styrene) and poly-(ferrocenylsilane) surfaces were approximately 90° for water, 55° for diiodomethane, and 78° glycerol. Using the acid-base interaction theory (van Oss, C. J.; Ju, L.; Chaudhury, M. K.; Good, R. J. J. Colloid Interface Sci. 1989, 128, 313), this resulted in a surface energy α = 33 mN/m.
60. Leclère, Ph.; Lazzaroni, R.; Brédas, J. L.; Yu, J. M.; Dubois, Ph.; Jérôme, R. Langmuir 1996, 12, 4317.
61. Bar, G.; Thomann, Y.; Brandsch, R.; Cantow, H.-J.; Whangbo, M.-H. Langmuir 1997, 13, 3807.
62. Pickering, J. P.; Vancso, G. J. Polym. Bull. 1998, 40, 549.
63. Lammertink, R. G. H.; Hempenius, M. A.; Vancso, G. J. Langmuir 2000, 16, 6245.
64. Fasolka, M. J.; Banerjee, P.; Mayes, A. M.; Pickett, G.; Balazs, A. C. Macromolecules 2000, 33, 5702.
65. Harrison, C.; Park, M.; Chaikin, P.; Register, R. A.; Adamson, D. H.; Yao, N. Macromolecules 1998, 31, 2185.
66. (a) Koppi, K. A.; Tirrell, M.; Bates, F. S. J. Rheol. 1994, 38, 999.
67. (b) Sakurai, S.; Hashimoto, T.; Fetters, L. J. Macromolecules 1996, 29, 740.
68. Seeck, O. H.; Kaendler, I. D.; Tolan, M.; Shin, K.; Rafailovich, M. H.; Sokolov, J.; Kolb, R. Appl. Phys. Lett. 2000, 76, 2713.
69. Parratt, L. G. Phys. Rev. 1954, 95, 359.
70. (a) Kim, G.; Libera, M. Macromolecules 1998, 31, 2569.
71. (b) Kim, G.; Libera, M. Macromolecules 1998, 31, 2670.
72. Mansky, P.; Chaikin, P.; Thomas, E. L. J. Mater. Sci. 1995, 30, 1987.