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Volumn 12, Issue 26, 1996, Pages 6681-6690

Confinement-induced morphological changes in diblock copolymer films

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000373599     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la960608e     Document Type: Article
Times cited : (88)

References (49)
  • 30
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    • note
    • -2) was used to estimate the resolution for beam collimation conditions employed.
  • 31
    • 0004204007 scopus 로고
    • Nijhoff: Dordrecht, The Netherlands
    • Lekner, J. Theory of Reflection; Nijhoff: Dordrecht, The Netherlands, 1987.
    • (1987) Theory of Reflection
    • Lekner, J.1
  • 33
    • 7044240139 scopus 로고    scopus 로고
    • Unpublished results
    • Koneripalli; et al. Unpublished results.
    • Koneripalli1
  • 34
    • 85086288374 scopus 로고    scopus 로고
    • note
    • 32
  • 35
    • 85086288666 scopus 로고    scopus 로고
    • note
    • max for other thicknesses (L/D* < 1.31) is much lower because the lamellae are not oriented parallel to the surfaces.
  • 39
    • 7044234065 scopus 로고    scopus 로고
    • note
    • max value is mainly attributed to a sharpening of the dPS/PVP interfaces by about 4 Å deduced from the fits shown in Figure 10.
  • 41
    • 7044254067 scopus 로고    scopus 로고
    • note
    • This was determined from AFM measurements that indicated approximately 30% hole area coverage and over 92% of the holes (by area) had a size between 1 and 5 μm. These measurements were performed on a Nanoscope III (Digital Instruments). Silicon nitride cantilever probes with a spring constant of ∼0.06 N/m were used in the contact mode.
  • 42
    • 7044252401 scopus 로고    scopus 로고
    • note
    • XPS spectra was collected on a Perkin-Elmer (PHI 5400) instrument equipped with a Mg anode operating at 300 W that had a hemispherical analyzer. Integrated background correction was employed.
  • 45
    • 85086289814 scopus 로고    scopus 로고
    • note
    • 1/2.
  • 49
    • 7044275158 scopus 로고    scopus 로고
    • In preparation
    • Matsen, M. W. In preparation.
    • Matsen, M.W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.