Structure and diffusion of asymmetric diblock copolymers in thin films: A dynamic secondary ion mass spectrometry study

Macromolecules

Volumn 31, Issue 25, 1998, Pages 8826-8830

  Yokoyama, Hideaki ^a   Kramer, Edward J ^a   Rafailovich, Miriam H ^b   Sokolov, Jonathan ^b   Schwarz, Steven A ^c  

^a University of California   (United States)

^b Stony Brook University   (United States)

^c CITY UNIVERSITY OF NEW YORK   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BLOCK COPOLYMERS; MOLECULAR DYNAMICS; MOLECULAR STRUCTURE; MORPHOLOGY; POLYSTYRENES; SECONDARY ION MASS SPECTROMETRY; SILICON; VINYL RESINS; VOLUME FRACTION; X RAY SCATTERING;

SMALL ANGLE X RAY SCATTERING;

PLASTIC FILMS;

EID: 0032291137     PISSN: 00249297     EISSN: None     Source Type: Journal    
DOI: 10.1021/ma981302c     Document Type: Article

References (13)

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7. Note: The resolution function approximates a Gaussian and the depth resolution quoted corresponds to the full width at half-maximum of this function.
8. Schwarz, S. A.; Wilkens, B. J.; Pudensi, M. A. A.; Rafailovich, M. H.; Sokolov, J.; Zhao, X.; Zhao, W.; Zheng, X.; Russell, T. P.; Jones, R. A. L. Mol. Phys. 1992, 76, 937.
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11. Yokoyama, H.; Kramer, E. J.; Hajduk, D. A.; Bates, F. S. Manuscript in preparation.
12. For discussion of these mechanisms in atomic solids, see: Shewmon, P. G. Diffusion in Solids; McGraw-Hill: New York, 1963.
13. Van Kampen, N. G. Stochastic Processes in Physics and Chemistry; North-Holland Personal Library: Amsterdam, 1992.