Ordering of diblock PS-PBMA thin films: An X-ray reflectivity study

Physica B: Condensed Matter

Volumn 248, Issue 1-4, 1998, Pages 250-257

  Vignaud, G ^a   Gibaud, A ^a   Grubel G ^b   Joly, S ^a   Ausserre D ^a   Legrand, J F ^c   Gallot, Y ^d  

^a UNIVERSITÉ DU MAINE   (France)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^c CEA GRENOBLE   (France)

^d INSTITUT CHARLES SADRON   (France)

Author keywords

Diblock copolymer; Thin films; X ray reflectivity

Indexed keywords

ANNEALING; CRYSTAL SYMMETRY; INTERFACES (MATERIALS); ORDER DISORDER TRANSITIONS; PLASTIC FILMS; POLYBUTENES; POLYSTYRENES; SILICON; SUBSTRATES; THIN FILMS; X RAY ANALYSIS;

DIBLOCK COPOLYMERS; POLYBUTYLMETHACRYLATES; X RAY REFLECTIVITY;

BLOCK COPOLYMERS;

EID: 0032089581     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(98)00243-9     Document Type: Article

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