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From the morphology of the polymer blend thin film, it was already pointed out that there is no clear affinity for one of the two hydrophobic phases to preferentially wet the hydrophilic silicon substrate.
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33
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0342467565
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Auger electron spectroscopy (AES) data obtained for oxygen etched PFS homopolymer are consistent with the XPS results. Depth profiling (argon ion sputtering) indicated an approximately 10 nm thin layer rich of iron, silicon, and oxide at the surface of the oxygen etched polymer film.
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