Photo-carrier generation as the origin of Fowler-Nordheim-induced substrate hole current in thin oxides

IEEE Transactions on Electron Devices

Volumn 48, Issue 2, 2001, Pages 231-238

  Degraeve, Robin ^a   Macs, Herman E ^a  

^a IMEC   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER MOBILITY; HOLE TRAPS; INDUCED CURRENTS; LOGIC GATES; SUBSTRATES; THIN FILMS;

FOWLER-NORDHEIM-INDUCED SUBSTRATES; HOLE CURRENT; PHOTO-CARRIER GENERATION;

MOSFET DEVICES;

EID: 0035249861     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.902721     Document Type: Article

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