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Journal of Applied Physics

Volumn 80, Issue 1, 1996, Pages 304-317

Anode hole injection and trapping in silicon dioxide

(3) DiMaria, D J a Cartier, E a Buchanan, D A a

a IBM T J WATSON RESEARCH CENTER (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000814330 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.362821 Document Type: Article

Times cited : (190)

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