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Journal of Applied Physics

Volumn 57, Issue 2, 1985, Pages 443-452

Investigation of the SiO2-induced substrate current in silicon field-effect transistors

(2) Weinberg, Z A a Fischetti, M V a

a IBM T J WATSON RESEARCH CENTER (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000414563 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.334771 Document Type: Article

Times cited : (63)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.