Dose rate and bias dependency of total dose sensitivity of low dropout voltage regulators

IEEE Radiation Effects Data Workshop

Volumn , Issue , 2000, Pages 100-105

  McClure, Steven S ^a   Gorelick, Jerry L ^a   Pease, Ron ^a   Johnston, Allan H ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

IRRADIATION; PROTONS; SEMICONDUCTOR DEVICE TESTING; SPACE APPLICATIONS; VOLTAGE REGULATORS;

ENHANCED LOW DOSE RATE SENSITIVITY; TOTAL DOSE SENSITIVITY;

RADIATION EFFECTS;

EID: 0034500185     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (9)