An attempt to define conservative conditions for total dose evaluation of bipolar ICs

IEEE Transactions on Nuclear Science

Volumn 44, Issue 6 PART 1, 1997, Pages 1974-1980

  Bonora, L ^a   David, J P ^a  

^a ONERA   (France)

Author keywords

[No Author keywords available]

Indexed keywords

COMPARATOR CIRCUITS; DOSIMETRY; INTEGRATED CIRCUIT TESTING; OPERATIONAL AMPLIFIERS; RADIATION DAMAGE; THERMAL EFFECTS;

RADIATION HARDNESS; TOTAL DOSE EVALUATION;

BIPOLAR INTEGRATED CIRCUITS;

EID: 0031337406     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.658972     Document Type: Article

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