메뉴 건너뛰기




Volumn 44, Issue 6 PART 1, 1997, Pages 1939-1944

Degradation of precision reference devices in space environments

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUIT TESTING; IONIZATION OF SOLIDS; RADIATION DAMAGE;

EID: 0031338734     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.658965     Document Type: Article
Times cited : (32)

References (11)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.