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Volumn 44, Issue 6 PART 1, 1997, Pages 1939-1944
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Degradation of precision reference devices in space environments
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Author keywords
[No Author keywords available]
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Indexed keywords
INTEGRATED CIRCUIT TESTING;
IONIZATION OF SOLIDS;
RADIATION DAMAGE;
BANDGAP REFERENCE CIRCUITS;
PRECISION REFERENCE DEVICES;
SPACECRAFT INSTRUMENTS;
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EID: 0031338734
PISSN: 00189499
EISSN: None
Source Type: Journal
DOI: 10.1109/23.658965 Document Type: Article |
Times cited : (32)
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References (11)
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