Comparison of total dose effects on micropower op-amps: bipolar and CMOS

IEEE Radiation Effects Data Workshop

Volumn , Issue , 1998, Pages 132-136

  Lee, C I ^a   Johnston, A H ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR SEMICONDUCTOR DEVICES; CMOS INTEGRATED CIRCUITS; DOSIMETRY; RADIATION DAMAGE;

TOTAL DOSE EFFECTS;

RADIATION EFFECTS;

EID: 0032303891     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)