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Volumn 69, Issue 8, 1996, Pages 1053-1055

Nitrogen incorporation in thin oxides by constant current N2O plasma anodization of silicon and N2 plasma nitridation of silicon oxides

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0001371232     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.116928     Document Type: Article
Times cited : (44)

References (19)
  • 18
    • 0004270256 scopus 로고
    • Perkin-Elmer Corporation Oct.
    • Handbook of XPS, Perkin-Elmer Corporation (Oct. 1992).
    • (1992) Handbook of XPS


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.