On-wafer measurements of noise temperature

IEEE Transactions on Instrumentation and Measurement

Volumn 48, Issue 6, 1999, Pages 1259-1269

  Randa, J ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

NUMERICAL ANALYSIS; PROBABILITY; SILICON WAFERS; SUPERCONDUCTING ELECTRIC LINES; TEMPERATURE;

ESTIMATED STANDARD UNCERTAINTY; NOISE TEMPERATURE MEASUREMENT;

THERMAL NOISE;

EID: 0033332342     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.816146     Document Type: Article

References (24)

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