Amplifier noise measurements at NIST

IEEE Transactions on Instrumentation and Measurement

Volumn 46, Issue 2, 1997, Pages 482-485

  Wait, David F ^a,b   Randa, James ^a,b  

^a IEEE   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SIGNAL NOISE MEASUREMENT; SIGNAL TO NOISE RATIO;

NOISE FIGURE MEASUREMENT;

AMPLIFIERS (ELECTRONIC);

EID: 0031119360     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.571891     Document Type: Article

References (11)

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