Experimental investigation of on-wafer noise parameter measurement accuracy

IEEE MTT-S International Microwave Symposium Digest

Volumn 3, Issue , 1996, Pages 1277-1280

  Boudiaf, Ali ^a   Scavennec, Andre ^a  

^a UNIVERSITÉ GUSTAVE EIFFEL   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC NETWORK ANALYSIS; ELECTRIC NETWORK PARAMETERS; INTEGRATED CIRCUIT TESTING; SIGNAL NOISE MEASUREMENT; SPURIOUS SIGNAL NOISE;

NOISE PARAMETER MEASUREMENT UNCERTAINTY; ON WAFER CHARACTERIZATION; OUTPUT MISMATCH;

MONOLITHIC MICROWAVE INTEGRATED CIRCUITS;

EID: 0029723433     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)