Microwave noise characterization of GaAs MESFET's: Evaluation by on-wafer low-frequency output noise current measurement

IEEE Transactions on Microwave Theory and Techniques

Volumn 35, Issue 12, 1987, Pages 1208-1218

  Gupta, Madhu S ^a   Pitzalis, Octavius ^b   Rosenbaum, Steven E ^b   Greiling, Paul T ^b  

^a UNIVERSITY OF ILLINOIS AT CHICAGO   (United States)

^b Hughes Aircraft Co   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84993746855     PISSN: 00189480     EISSN: 15579670     Source Type: Journal    
DOI: 10.1109/TMTT.1987.1133839     Document Type: Article

References (21)

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