Noise parameter data comparison while varying the on-wafer S-parameter calibration technique

44th ARFTG Conference Digest - Fall 1994

Volumn , Issue , 1994, Pages 89-97

  Randy Fenton, J ^a  

^a NORTHROP GRUMMAN CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION;

NOISE PARAMETERS; ON-WAFER; ON-WAFER DEVICES; PARAMETER CALIBRATION;

SCATTERING PARAMETERS;

EID: 85061374449     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ARFTG.1994.327085     Document Type: Conference Paper

References (5)

1. ATN, Inc. NPSB Reference Manual, Version NP5B.Ol.04, June 29, 1990.
2. J. J. Raggio, "Results of an on-wafer noise-parameter measurement comparison," 36th ARFTG Conf.Dig., pp. 26-35, Fall 1990.
3. R. B. Marks, "Amultiline method of network analyzer calibration," ZEEE Trans. Microwave Theory and Tech., vol. 39, pp. 1205-1215,1991.
4. D. F. Williams, R. B. Marks and K. Phillips, "Progresstoward on-wafer standards at NIST," 34th ARFTG Conf.Dig. (FL),Nov. 1989.
5. A. Davidson, E. Strid, and K. Jones, "Achieving greater on-wafer S-parameter accuracy with the LRM calibration technique," 34th ARFTG Conf.Dig.,pp. 61-66, November 1989.