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Volumn , Issue , 1990, Pages 16-25

Improvements to on-wafer noise parameter measurements

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC NOISE MEASUREMENT; DESIGN FOR TESTABILITY; REFLECTOMETERS;

EID: 33749919520     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ARFTG.1990.323992     Document Type: Conference Paper
Times cited : (12)

References (7)
  • 1
    • 33845880020 scopus 로고
    • 2-26. 5 GHz on-wafer noise and s-parameter measurements using a solid state tuner
    • Dec.
    • V. Adamian, "2-26. 5 GHz On-Wafer Noise and S-parameter Measurements Using a Solid State Tuner" IEEE ARFTG Digest, pp. 33, Dec. 1989.
    • (1989) IEEE ARFTG Digest , pp. 33
    • Adamian, V.1
  • 2
    • 0024107374 scopus 로고
    • Repeatability and verification of on-wafer noise parameter measurements
    • Nov.
    • A. Fraser, E. Strid, B. Leake and T. Burcham, "Repeatability and Verification of On-Wafer Noise Parameter Measurements. " Microwave J., pp. 172, Nov. 1988.
    • (1988) Microwave J. , pp. 172
    • Fraser, A.1    Strid, E.2    Leake, B.3    Burcham, T.4
  • 3
    • 0024888749 scopus 로고
    • Accuracy improvements in microwave noise parameter measurements
    • Dec.
    • A. C. Davidson, B. W. Leake and E. Strid, "Accuracy Improvements in Microwave Noise Parameter Measurements, " IEEE Trans, and Tech., vol. MTT-37 (12) pp. 1973-1977, Dec. 1989.
    • (1989) IEEE Trans, and Tech. , vol.MTT-37 , Issue.12 , pp. 1973-1977
    • Davidson, A.C.1    Leake, B.W.2    Strid, E.3
  • 4
    • 0022703116 scopus 로고
    • On the measurement of noise parameters of microwave two-ports
    • April
    • M. W. Pospieszalski, "On the Measurement of Noise Parameters of Microwave Two-Ports, " MTT, vol. 34 (4) pp. 456-458, April 1986.
    • (1986) MTT , vol.34 , Issue.4 , pp. 456-458
    • Pospieszalski, M.W.1
  • 5
    • 33644769709 scopus 로고
    • Achieving greater on-wafer s-parameter accuracy with the lrm calibration technique
    • Dec.
    • A. Davidson, E. Strid and K. Jones, "Achieving Greater On-Wafer S-parameter Accuracy with the LRM Calibration Technique. " IEEE ARFTG Digest, pp. 61, Dec. 1989.
    • (1989) IEEE ARFTG Digest , pp. 61
    • Davidson, A.1    Strid, E.2    Jones, K.3
  • 6
    • 85068074543 scopus 로고
    • Results of a multi-site round-robin to examine probed measurements of an impedance standard substrate
    • Dec.
    • J. Raggio, "Results of a Multi-Site Round-Robin to Examine Probed Measurements of an Impedance Standard Substrate. " IEEE ARFTG Digest, pp. 41, Dec. 1989.
    • (1989) IEEE ARFTG Digest , pp. 41
    • Raggio, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.