|
Volumn , Issue , 1990, Pages 16-25
|
Improvements to on-wafer noise parameter measurements
a b |
Author keywords
[No Author keywords available]
|
Indexed keywords
ACOUSTIC NOISE MEASUREMENT;
DESIGN FOR TESTABILITY;
REFLECTOMETERS;
DATA POINTS;
FOUR-PARAMETER EQUATION;
NOISE MEASUREMENT SYSTEMS;
NOISE PARAMETERS;
NOISE SOURCE;
SOURCE IMPEDANCE;
STAGE GAINS;
TEST SETS;
NOISE FIGURE;
|
EID: 33749919520
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ARFTG.1990.323992 Document Type: Conference Paper |
Times cited : (12)
|
References (7)
|