Verification of On-Wafer Noise Parameter Measurements

IEEE Transactions on Instrumentation and Measurement

Volumn 44, Issue 2, 1995, Pages 332-335

  Boudiaf, Ali ^a   Dubon Chevallier, Chantal ^b   Pasquet, Daniel ^a  

^a EMO ENSEA ^*  (France)

^b ORANGE LABS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; CORRELATION METHODS; ELECTROMAGNETIC WAVE REFLECTION; FIELD EFFECT TRANSISTORS; MATRIX ALGEBRA; PASSIVE NETWORKS; PERFORMANCE; STANDARDS; THERMAL NOISE; THIN FILMS;

INSTRUMENTATION VERIFICATION; LANGE COUPLER; NOISE PARAMETER MEASUREMENT; ON WAFER MEASUREMENTS; ON WAFER NOISE; VERIFICATION ARTIFACT;

SIGNAL NOISE MEASUREMENT;

EID: 0029290160     PISSN: 00189456     EISSN: 15579662     Source Type: Journal    
DOI: 10.1109/19.377845     Document Type: Article

References (8)

1. A. Fraser, E. Strid, et al., “Repeatability and verification of on-wafer noise parameter measurements,” Microwave J., Nov. 1988.
2. A. C. Davidson, E. Strid, et al., “Accuracy improvements in microwave noise parameter measurements,” IEEE Trans. Microwave Theory Technol., vol. 37, pp. 1973–1978, Dec. 1989.
3. L. Escotte, J. Graffeuil, et al., “Using cold FET to check accuracy of microwave noise parameter test set,” Electron. Lett., pp. 833–835, May 1991.
4. A. Boudiaf, N. Hassa$iUne, and A. Konczykowska. France Telecom Patent, N/Ref CNET/02112.
5. A. Boudiaf, M. Laporte, et al., “Accuracy improvements in two-port noise parameter extraction methods,” IEEE MTT-S Int. Microwave Symp. Digest, pp. 1569–1572, 1992.
6. A. Boudiaf and M. Laporte, “An accurate and repeatable technique for noise parameter measurements,” IEEE Trans. Instrument. Measure., vol. 42, pp. 532–537, Apr. 1993.
7. M. Moreau and A. Mathieu, Statistique appliquée à l'expérimentation. Eyrolles, Ed.
8. L. Escotte, R. Plana, and J. Graffeuil, “Evaluation of noise parameter extraction methods,” IEEE Trans. Microwave Theory Technol., vol. 41, pp. 382–387, Mar. 1993.