|
Volumn , Issue , 1989, Pages 33-40
|
2-26.5 GHz on-wafer noise and S-parameter measurements using a solid state tuner
|
Author keywords
[No Author keywords available]
|
Indexed keywords
ELECTRIC NETWORK ANALYZERS;
NOISE FIGURE;
PARAMETER ESTIMATION;
TUNERS;
IMPEDANCE TUNERS;
NOISE PARAMETERS;
ON-WAFER;
S-PARAMETER MEASUREMENTS;
TEST SETS;
VECTOR NETWORK ANALYZERS;
SCATTERING PARAMETERS;
|
EID: 33845880020
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ARFTG.1989.4119522 Document Type: Conference Paper |
Times cited : (11)
|
References (11)
|