Accuracy improvements to on-wafer amplifier noise figure measurements

38th ARFTG Conference Digest - Winter 1991

Volumn , Issue , 1991, Pages 129-138

  Woodin, C E ^a   Wandrei, D L ^a   Adamian, V ^a  

^a ATN Microwave Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LOW NOISE AMPLIFIERS;

ACCURACY IMPROVEMENT; AMPLIFIER NOISE; FIGURE MEASUREMENT; MEASUREMENT TIME; ON-WAFER; VECTOR MEASUREMENTS;

NOISE FIGURE;

EID: 33749972534     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ARFTG.1991.4119622     Document Type: Conference Paper

References (2)

1. Adamian, V and A. Uhlir Jr., "A Novel Procedure for Receiver Noise Characterization" IEEE Transactions on Instrumentation and Measurement Volume IM-22, No. 2, pp. 181-182, June 1973.
2. Adamian, V and A. Uhlir, Jr., "Simplified Noise evaluation of Microwave Receivers" IEEE Transactions on Instrumentation and Measurement Volume IM-33, No. 2, pp. 136-140, June 1984.