A Ka-band on-wafer S-parameter and noise figure measurement system

34th ARFTG Conference Digest - Winter 1989

Volumn , Issue , 1989, Pages 127-137

  Dunleayy, Lawrence P ^a  

^a RAYTHEON COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; MICROWAVE AMPLIFIERS; PARAMETER ESTIMATION; PROBES; SCATTERING PARAMETERS; WAVEGUIDES;

AUTOMATIC NETWORKS; FIGURE MEASUREMENT; INPUT TRANSITION; MMIC AMPLIFIERS; NOISE CALIBRATION; NOISE SOURCE; S-PARAMETER MEASUREMENTS; SYSTEM CALIBRATION;

NOISE FIGURE;

EID: 33749891815     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ARFTG.1989.4119531     Document Type: Conference Paper

References (7)

1. R. Q. Lane, The determination of device noise parameters, " Proc. IEEE, (Letters), vol. 57, pp. 1461-1462, Aug. 1969.
2. "Noise figure measurement accuracy", HP Application Note 57-2.
3. P. R. Tong, and J. M. Moorehead "Noise measurements at mm-wave frequencies, " Microwave J. pp. 69-86, July 1988.
4. G. F. Engen "A method of calibrating coaxial noise sources in terms of a waveguide standard, " IEEE Trans. Microwave Theory and Tech., vol. MTT-16, pp 636-639, Sept. 1968.
5. E. W. Strid "Measurement of losses in noise matching networks, " IEEE Trans. Microwave Theory and Tech., vol. MTT-29, PP. 247-252, Mar. 1981.
6. J. Fitzpatrick and J. Williams, "Measuring noninsertable devices with an ANA", Microwave Sys. News, pp. 96-104, June 1981.
7. "Measuring noninsertable devices" HP Product Note 8510-13.