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Volumn 39, Issue 7, 1991, Pages 1205-1215

A Multiline Method of Network Analyzer Calibration

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC NETWORKS--TRANSMISSION LINE THEORY; STANDARDS; STATISTICAL METHODS; TELECOMMUNICATION LINES;

EID: 0026188064     PISSN: 00189480     EISSN: 15579670     Source Type: Journal    
DOI: 10.1109/22.85388     Document Type: Article
Times cited : (1032)

References (12)
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    • G. F. Engen and C. A. Hoer, “Thru-reflect-line: An improved technique for calibrating the dual six-port automatic network analyzer,” IEEE Trans. Microwave Theory Tech., vol. MTT-27, pp. 987–993, Dec. 1979.
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  • 3
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    • Dec
    • G. F. Engen, “A least squares solution for use in the six-port measurement technique,” IEEE Trans. Microwave Theory Tech., vol. MTT-28, 1473–1477, Dec. 1980.
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  • 4
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    • A statistical method for calibrating the six-port reflectometer using nonideal standards
    • Nov
    • S. P. Jachim and W. Daril Gutscher, “A statistical method for calibrating the six-port reflectometer using nonideal standards,” IEEE Trans. Microwave Theory Tech., vol. 37, pp. 1825–1828, Nov. 1989.
    • (1989) IEEE Trans. Microwave Theory Tech. , vol.37 , pp. 1825-1828
    • Jachim, S.P.1    Gutscher, W.D.2
  • 5
    • 0025445789 scopus 로고
    • De-embedding and unterminating microwave fixtures with nonlinear least squares
    • June
    • D. Williams, “De-embedding and unterminating microwave fixtures with nonlinear least squares,” IEEE Trans. Microwave Theory Tech., vol. 38, pp. 787–791, June 1990.
    • (1990) IEEE Trans. Microwave Theory Tech. , vol.38 , pp. 787-791
    • Williams, D.1
  • 6
    • 79952623797 scopus 로고
    • Wafer-level ANA calibrations at NIST
    • presented at 34th ARFTG Conference
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    • (1989)
    • Marks, R.1    Phillips, K.2
  • 7
    • 0025564942 scopus 로고
    • MMIC related metrology at the National Institute of Standards and Technology
    • Dec
    • G. Reeve, R. Marks, and D. Blackburn, “MMIC related metrology at the National Institute of Standards and Technology,” IEEE Trans. Instrum. Meas., vol. 39, pp. 958–961, Dec. 1990.
    • (1990) IEEE Trans. Instrum. Meas. , vol.39 , pp. 958-961
    • Reeve, G.1    Marks, R.2    Blackburn, D.3
  • 8
    • 0042174869 scopus 로고
    • Multi-line calibration for MMIC measurement
    • presented at 36th ARFTG Conference
    • R. Marks, “Multi-line calibration for MMIC measurement,” presented at 36th ARFTG Conference, 1990.
    • (1990)
    • Marks, R.1
  • 9
    • 0024771479 scopus 로고
    • A unified mathematical approach to two-port calibration techniques and some applications
    • Nov
    • R. A. Soares, P. Gouzien, P. Legaud, and G. Follot, “A unified mathematical approach to two-port calibration techniques and some applications,” IEEE Trans. Microwave Theory Tech., vol. 37, pp. 1669–1674, Nov. 1989.
    • (1989) IEEE Trans. Microwave Theory Tech. , vol.37 , pp. 1669-1674
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  • 10
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    • On-line accuracy assessment for the dual six-port ANA: Treatment of systematic errors
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    • (1987) IEEE Trans. Instrum. Meas. , vol.36 , pp. 514-519
    • Hoer, C.A.1
  • 11
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    • in, Sept
    • H.-J. Eul and B. Schiek, “Thru-match-reflect: One result of a rigorous theory for de-embedding and network analyzer calibration,” in Proc. 18th European Microwave Conf., Sept. 1988, pp. 909–914.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.