Test challenges in nanometric CMOS technologies

Microelectronic Engineering

Volumn 49, Issue 1, 1999, Pages 119-133

  Figueras, Joan ^a   Brosa, Anna M ^a   Ferré, Antoni ^a  

^a UNIVERSITAT POLITÈCNICA DE CATALUNYA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC CURRENTS; INTEGRATED CIRCUIT TESTING; NANOSTRUCTURED MATERIALS;

MEGATRANSISTOR CHIPS;

MICROELECTRONICS;

EID: 0033225409     PISSN: 01679317     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-9317(99)00433-5     Document Type: Article

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